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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
亞洲大學 |
2015-06 |
Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD stress
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蔡宗叡;TSAI, JUNG-RUEY;楊紹明;Yang, Shao-Ming;許健;Sheu, Gene;Cha, Ruey Dar;Chang, Ruey Dar;We, Ting Ting;Wen, Ting Ting |
亞洲大學 |
2015-02 |
ENGINEERED THRESHOLD VOLTAGE IN ALGAN/GAN HEMTS FOR NORMALLY-OFF OPERATION
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蔡宗叡;TSAI, JUNG-RUEY;Cha, Yi-Sheng;Chang, Yi-Sheng;Wei, Kuo-Shu;Wei, Kuo-Shu;We, Ting-Ting;Wen, Ting-Ting |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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