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Showing items 1-10 of 15 (2 Page(s) Totally)
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| 臺大學術典藏 |
2020-07-03T08:28:34Z |
A highly polymorphic STR locus in Cannabis sativa
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Hsieh H.-M.;Hou R.-J.;Tsai L.-C.;Wei C.-S.;Liu S.-W.;Huang L.-H.;Kuo Y.-C.;Linacre A.;James Chun-I Lee; Hsieh H.-M.; Hou R.-J.; Tsai L.-C.; Wei C.-S.; Liu S.-W.; Huang L.-H.; Kuo Y.-C.; Linacre A.; JAMES CHUN-I LEE |
| 臺大學術典藏 |
2020-03-06T03:42:43Z |
SHEWMA: an end-of-line SPC scheme using wafer acceptance test data
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Fan C.-M.; Guo R.-S.; Chang S.-C.; Wei C.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:43Z |
SHEWMAC: An end-of-line SPC scheme via exponentially weighted moving statistics
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Fan C.-M.; Chang S.-C.; Guo R.-S.; Kung H.-H.; You J.-C.; Chen H.-P.; Lin S.; Wei C.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-06T03:42:38Z |
Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data
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Fan C.-M.;Guo R.-S.;Chen A.;Hsu K.-C.;Wei C.-S.; Fan C.-M.; Guo R.-S.; Chen A.; Hsu K.-C.; Wei C.-S.; RUEY-SHAN GUO |
| 臺大學術典藏 |
2020-03-02T06:39:58Z |
Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data
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Fan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; Wei, C.-S.; ARGON CHEN |
| 臺大學術典藏 |
2018-09-10T08:35:55Z |
Suppression of heregulin-β1/HER2-modulated invasive and aggressive phenotype of breast carcinoma by pterostilbene via inhibition of matrix metalloproteinase-9, p38 kinase cascade and Akt activation
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MIN-HSIUNG PAN;Ho, C.-T.;Wei, C.-S.;Lin, C.-L.;Lin, Y.-T.;Pan, M.-H.;Chen, W.-J.; Chen, W.-J.; Pan, M.-H.; Lin, Y.-T.; Lin, C.-L.; Wei, C.-S.; Ho, C.-T.; MIN-HSIUNG PAN |
| 臺大學術典藏 |
2018-09-10T03:29:42Z |
SHEWMAC: An end-of-line SPC scheme via exponentially weighted moving statistics
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Fan, C.-M.; Chang, S.-C.; Guo, R.-S.; Kung, H.-H.; You, J.-C.; Chen, H.-P.; Lin, S.; Wei, C.-S.; SHI-CHUNG CHANG; Guo, Ruey-Shan |
| 國立臺灣大學 |
2008-03 |
Metallic switiching of seiconducting single-walled carbon nanotubes with ZnO thin film
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Wei, C. S.; Su, C. C.; Chang, S. H. |
| 大葉大學 |
2007-12 |
Improving the Performance of SiGe Meatl-Semiconductor-Metal Photodetectors by using an Amorphous Silicon Passivation Layer
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Chen, Y.H.;Hwang, Jun-Dar;Kung, C.Y.;Chen, P.S.;Wei, C.S.;Wu, C.K.;Liu, J.C. |
| 大葉大學 |
2007-01 |
Liquid Phase Deposition silicon dioxide for surface passivation in SiGe metal-semiconductor-metal photodetectors
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Hwang, J.D.;Kung, C.Y.;Chen, Y.H.;Wei, C.S.;Chen, P.S. |
Showing items 1-10 of 15 (2 Page(s) Totally)
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