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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立成功大學 2022 Material Properties and Structural Applications of UHPC [UHPC材料性質與工程應用] Yen, C.-H.;Wei, J.-Y.;Wen, K.-W.;Hung, C.-C.
臺大學術典藏 2021-11-22T02:27:21Z Yeast-produced IAA is not only involved in the competition among yeasts but also promotes plant growth and development Fu, S.-F.; Chen, H.-W.; Wei, J.-Y.; Lee, Y.-I.; Chou, J.-Y.
臺大學術典藏 2018-09-10T05:58:49Z Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W.; CHEE-WEE LIU
國立臺灣大學 2009 Non-catastrophic landslides induced by the Mw 7.6 Chi-Chi earthquake in central Taiwan as revealed by PIV analysis Tseng, C.-H.; Hu, J.-C.; Chan, Y.-C.; Chu, H.-T.; Lee, J.-F.; Wei, J.-Y.; Lu,C.-Y.; Lin, M.L.
國立臺灣大學 2006 Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W.
國立臺灣大學 2006 Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W.
臺北醫學大學 2005 Clinical study of a newly developed injection-type gingival retraction material 林哲堂; 李勝揚; 蔡志孟; Yang J-C; Tsai C-M; Chen M-S; Wei J-Y; Lee S-Y; Lin C-T
國立臺灣大學 2004 Evidence of Si/SiGe heterojunction roughness scattering Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S.
臺大學術典藏 2004 Evidence of Si/SiGe heterojunction roughness scattering Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S.Liucw; Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S.; LiuCW

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