|
|
???tair.name??? >
???browser.page.title.author???
|
"wei j y"???jsp.browse.items-by-author.description???
Showing items 1-9 of 9 (1 Page(s) Totally) 1 View [10|25|50] records per page
| 國立成功大學 |
2022 |
Material Properties and Structural Applications of UHPC [UHPC材料性質與工程應用]
|
Yen, C.-H.;Wei, J.-Y.;Wen, K.-W.;Hung, C.-C. |
| 臺大學術典藏 |
2021-11-22T02:27:21Z |
Yeast-produced IAA is not only involved in the competition among yeasts but also promotes plant growth and development
|
Fu, S.-F.; Chen, H.-W.; Wei, J.-Y.; Lee, Y.-I.; Chou, J.-Y. |
| 臺大學術典藏 |
2018-09-10T05:58:49Z |
Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices
|
Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣大學 |
2009 |
Non-catastrophic landslides induced by the Mw 7.6 Chi-Chi earthquake in central Taiwan as revealed by PIV analysis
|
Tseng, C.-H.; Hu, J.-C.; Chan, Y.-C.; Chu, H.-T.; Lee, J.-F.; Wei, J.-Y.; Lu,C.-Y.; Lin, M.L. |
| 國立臺灣大學 |
2006 |
Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices
|
Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W. |
| 國立臺灣大學 |
2006 |
Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices
|
Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W. |
| 臺北醫學大學 |
2005 |
Clinical study of a newly developed injection-type gingival retraction material
|
林哲堂; 李勝揚; 蔡志孟; Yang J-C; Tsai C-M; Chen M-S; Wei J-Y; Lee S-Y; Lin C-T |
| 國立臺灣大學 |
2004 |
Evidence of Si/SiGe heterojunction roughness scattering
|
Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S. |
| 臺大學術典藏 |
2004 |
Evidence of Si/SiGe heterojunction roughness scattering
|
Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S.Liucw; Liu, C. W.; Lee, M. H.; Lee, Y. C.; Chen, P. S.; Yu, C.-Y.; Wei, J.-Y.; Maikap, S.; LiuCW |
Showing items 1-9 of 9 (1 Page(s) Totally) 1 View [10|25|50] records per page
|