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| 臺大學術典藏 |
2018-09-10T07:37:15Z |
SHEWMAC: An end-of-line SPC scheme for joint monitoring of process mean and variance
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Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John; SHI-CHUNG CHANG |
| 國立臺灣大學 |
2003-10 |
Integrated yield-mining solution with enhanced electrical test data correlation
|
Fan, Chih-Min; Guo, Ruey-Shan; Chen, Argon; Hon, Amos; Wei, John; King, Mingchu |
| 臺大學術典藏 |
2003-10 |
Integrated yield-mining solution with enhanced electrical test data correlation
|
King, Mingchu; Hon, Amos; Wei, John; Chen, Argon; Guo, Ruey-Shan; Fan, Chih-Min; Fan, Chih-Min; Guo, Ruey-Shan; Chen, Argon; Hon, Amos; Wei, John; King, Mingchu |
| 國立臺灣大學 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
|
Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
| 臺大學術典藏 |
1999-10 |
SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance
|
Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John; Fan, Chih-Min; Chang, Shi-Chung; Guo, Ruey-Shan; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John |
Showing items 1-5 of 5 (1 Page(s) Totally)
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