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机构 日期 题名 作者
元智大學 2014-03-28 Automatic visual inspection of solar wafers using mean-shift techniques Du-Ming Tsai; Wei-Yao Chiu; Jie-Yu Luo
元智大學 2013-12-03 Automatic visual inspection of solar modules using Independent component analysis Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學 2013-05-20 A real-time ICA-based activity recognition in video sequences Du-Ming Tsai; Wei-Yao Chiu
元智大學 2013-02-21 Dual-mode detection for foreground segmentation in low-contrast video images Du-Ming Tsai; Wei-Yao Chiu
元智大學 2013-02 Defect Detection in Solar Modules Using ICA Basis Images Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學 2013 Defect Detection in Solar Modules Using ICA Basis Images Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學 2012-12-02 A Shift-tolerant Dissimilarity Measure for Surface Defect Detection Du-Ming Tsai; I-Yung Chiang; Hao Hsu; Wei-Yao Chiu
元智大學 2012-12-02 A Shift-tolerant Dissimilarity Measure for Surface Defect Detection Du-Ming Tsai; I-Yung Chiang; Hao Hsu; Wei-Yao Chiu
元智大學 2012-09 A fast regularity measure for surface defect detection Du-Ming Tsai; Ming-Chun Chen; Wei-Chen Li; Wei-Yao Chiu
元智大學 2012-06-28 A PCA-based regularity measure for surface defect inspection Du-Ming Tsai; Wei-Yao Chiu; Ming-Chun Chen

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