| 國立交通大學 |
2015-07-21T08:31:07Z |
Flow-and-VM Migration for Optmizing Throughput and Energy in SDN-based Cloud Datacenter
|
Lin, Wei-Chu; Liao, Chien-Hui; Kuo, Kuan-Tsen; Wen, Charles H-P. |
| 國立交通大學 |
2015-07-21T08:30:53Z |
Suppressing Test Inflation in Shared-Memory Parallel Automatic Test Pattern Generation
|
Ku, Jerry C. Y.; Huang, Ryan H. -M.; Lin, Louis Y. -Z.; Wen, Charles H. -P. |
| 國立交通大學 |
2015-07-21T08:28:51Z |
A Determinate Radiation Hardened Technique for Safety-Critical CMOS Designs
|
Huang, Ryan H. -M.; Hsu, Dennis K. -H.; Wen, Charles H. -P. |
| 國立交通大學 |
2015-07-21T08:28:05Z |
Demystifying Iddq Data With Process Variation for Automatic Chip Classification
|
Chang, Chia-Ling (Lynn); Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-13T10:46:08Z |
針對3D整合之電子設計自動化技術開發---子計畫五：應用在驗證與測試3D IC整合過程中以計算智慧為基礎的測試向量產生方法(II)
|
溫宏斌; Wen Charles H.-P. |
| 國立交通大學 |
2014-12-13T10:45:01Z |
後次微米時代新興電子設計自動化技術之研究---子計畫四：應用計算智慧推理處理後深次微米時代電路設計上的可靠度挑戰(III)
|
溫宏斌; Wen Charles H.-P. |
| 國立交通大學 |
2014-12-08T15:38:46Z |
Monte-Carlo-based Statistical Soft Error Rate (SSER) Analysis for the Deep Sub-micron Era
|
Kuo, Yu-Shin; Peng, Huan-Kai; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:33:13Z |
Aging-aware Statistical Soft-Error-Rate Analysis for Nano-Scaled CMOS Designs
|
Lin, Cosette Y. H.; Huang, Ryan H. -M.; Wen, Charles H. -P.; Chang, Austin C. -C. |
| 國立交通大學 |
2014-12-08T15:32:44Z |
(DENDIST)-E-2: Dynamic and Disjoint ENDIST-based Layer-2 Routing Algorithm for Cloud Datacenters
|
Liu, Gen-Hen; Wen, Charles H. -P; Wang, Li-Chun |
| 國立交通大學 |
2014-12-08T15:32:42Z |
Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection
|
Huang, Hsuan-Ming; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:32:22Z |
CASSER: A Closed-Form Analysis Framework for Statistical Soft Error Rate
|
Chang, Austin C. -C.; Huang, Ryan H. -M.; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:31:30Z |
Fast Scan-Chain Ordering for 3-D-IC Designs Under Through-Silicon-Via (TSV) Constraints
|
Liao, Christina C-H.; Chen, Allen W. -T.; Lin, Louis Y. -Z.; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:24:33Z |
An Intelligent Analysis of Iddq Data for Chip Classification in Very Deep-Submicron (VDSM) CMOS Technology
|
Chang, Chia-Ling (Lynn); Chang, Chia-Ching (Austin); Chan, Hui-Ling; Wen, Charles H. -P.; Bhadra, Jayanta |
| 國立交通大學 |
2014-12-08T15:23:59Z |
Mining Unreachable Cross-timeframe State-pairs for Bounded Sequential Equivalence Checking
|
Chang, Lynn C. -L; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:22:06Z |
Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs
|
Peng, Huan-Kai; Huang, Hsuan-Ming; Kuo, Yu-Hsin; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:21:00Z |
Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear Programming
|
Kao, Chen-Yuan; Liao, Chien-Hui; Wen, Charles H. -P. |
| 國立交通大學 |
2014-12-08T15:19:58Z |
Speeding up Bounded Sequential Equivalence Checking with Cross-Timeframe State-Pair Constraints from Data Learning
|
Chang, Chia-Ling(Lynn); Wen, Charles H. -P.; Bhadra, Jayanta |
| 國立交通大學 |
2014-12-08T15:12:33Z |
An incremental learning framework for estimating signal controllability in unit-level verification
|
Wen, Charles H. -P.; Wang, Li-C.; Bhadra, Jayanta |
