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Institution	Date	Title	Author
義守大學	2014-11	Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface	Po-Ying Chen;Chi-Chang Chen;Wen-Kuan Yeh;Yukan Chang;Der-Chen Huang;Shyr-Shen Yu;Chwei-Shyong Tsai;Yu-Jung Huang;Wei-Cheng Lin;Shao-I Chu;Chung-Long Pan;Tsung-Hung Lin;Shyh-Chang Liu
義守大學	2013-02	The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET	Wen-Kuan Yeh;Po-Ying Chen;Kwang-Jow Gan;Jer-Chyi Wang;Chao Sung Lai
國立高雄師範大學	2012-08	Reliability Improvement of 28nm High-k/Metal Gate-Last MOSFET using Appropriate Oxygen Annealing	Yi-Lin Yang;Wenqi Zhang;Chi-Yun Cheng;Yi-Ping Huang;Pin-Tseng Chen;Chia-Wei Hsu;Li-Kong Chin;Chien-Ting Lin;Che-Hua Hsu;Chien-Ming Lai ;Wen-Kuan Yeh; 楊宜霖
國立高雄師範大學	2012-06	Reliability Improvement of 28nm High-k/Metal Gate Device by Using Oxygen Annealing	Yi-Lin Yang;Wenqi Zhang;Chi-Yun Cheng;Yi-Ping Huang;Pin-Tseng Chen;Li-Kong Chin;Chia-Wei Hsu;Wen-Kuan Yeh; 楊宜霖
國立高雄師範大學	2012	The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions	Yi-Lin Yang;Wenqi Zhang;Chi-Yun Cheng;Wen-Kuan Yeh; 楊宜霖
國立高雄師範大學	2011-04	The Improvement of Reliability of 28nm High-k/Metal Gate Device with Various PMA Conditions	Chi-Yun Cheng;Wen-Kuan Yeh;Yi-Lin Yang;Chia-Wei Hsu; 楊宜霖
義守大學	2011-03	The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability using Optimized Si cap/SiGe Channel Structure	Wen-Kuan Yeh;Yu-Ting Chen;Fon-Shan Huang;Chia-Wei Hsu;Chun-Yu Chen;Yean-Kuen Fang;Kwang-Jow Gan;Po-Ying Chen
國立高雄大學	2011	Effect of Gate Capping Configurations and Silicon-on-Insulator Thickness with External Stresses on Partially Depleted MOSFETs	Wen-Teng Chang; Chih-Chung Wang; Jian-An Lin; Wen-Kuan Yeh
義守大學	2010-11	Relationship between wafer edge design and its ultimate mechanical strength	Po-Ying Chen ;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學	2010-11	Characteristics between Electrical Properties and Controlling of Oxygen Precipitations during ULSI Process	Po-Ying Chen;Shih-Chun Hung;Wen-Kuan Yeh;Ming Hsiung Tsai;Wei-Chou Chen;Kang-Ping Li;Pei-Chen Yeh;Hsin-Ying Huang
義守大學	2010-10	Relationship between wafer fracture reduction and controlling during the edge manufacturing process	Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學	2010-02	Relationship between wafer fracture reduction and controlling during the edge manufacturing process	Po-Ying Chen; Ming-Hsing Tsai; Wen-Kuan Yeh; Ming-Haw Jing; Yukon Chang
義守大學	2009-12	Investigation of the Relationship between Whole -Wafer Strength and Control of its Edge Engineering	Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學	2009-03	The Impact of Strain Technology on FUSI Gate SOI CMOSFET	Wen-Kuan Yeh;Jean-An Wang;Ming-Hsing Tsai;Chien-Ting Lin;Po-Ying Chen
義守大學	2008/08/20	Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue	Po-Ying Chen ; Chwei-Shyong Tsai ; Ming-Hsiung Tsai ; Heng-Yu Kung ; Shen-Li Chen ; Jing, M.H. ; Wen-Kuan Yeh
義守大學	2008/04/27	Effect of crystal-originated particles (COPs) on ULSI process integrity	Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. ; Wen-Kuan Yeh
義守大學	2008-10	Elucidating the effects of current stress history on reliability characteristics by dynamic analysis	Po-Ying Chen;Shen-Li Chen;Ming-Hsiung Tsai;Wen-Kuan Yeh;Heng-Yu Kung;YuKon Chang
義守大學	2008-02	Reliability and characteristics of wafer-level chip-scale packages under current stress	Po-Ying Chen;Heng-Yu Kung;Yi-Shao Lai;Ming Hsiung Tsai;Wen-Kuan Yeh
國立高雄師範大學	2008	A 1.2V Low-Power CMOS Voltage-Controlled Oscillator (VCO) Using Current-Reused Configuration with Balanced Resistors for IEEE 802.16e	Ruey-Lue Wang;Hsuan-Der Yen;Wen-Kuan Yeh;Yi-Jiue Shie; 王瑞祿
國立高雄師範大學	2007-12	2~10GHz UWB Low Noise Amplifier Using a Cascode Structure with Resistive Shunt Feedback	Ruey-Lue Wang;Yen-Chin Chen;Wen-Kuan Yeh;Hsuan-Der Yen; 王瑞祿
義守大學	2006/12/06	The effect of stressing history in reliability characteristics	Po-Ying Chen ; Heng-Yu Kung ; Yi-Shao Lai ; Wen-Kuan Yeh

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