臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
義守大學	2010-10	Relationship between wafer fracture reduction and controlling during the edge manufacturing process	Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學	2010-02	Relationship between wafer fracture reduction and controlling during the edge manufacturing process	Po-Ying Chen; Ming-Hsing Tsai; Wen-Kuan Yeh; Ming-Haw Jing; Yukon Chang
義守大學	2009-12	Investigation of the Relationship between Whole -Wafer Strength and Control of its Edge Engineering	Po-Ying Chen;Ming-Hsing Tsai;Wen-Kuan Yeh;Ming-Haw Jing;Yukon Chang
義守大學	2009-03	The Impact of Strain Technology on FUSI Gate SOI CMOSFET	Wen-Kuan Yeh;Jean-An Wang;Ming-Hsing Tsai;Chien-Ting Lin;Po-Ying Chen
義守大學	2008/08/20	Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue	Po-Ying Chen ; Chwei-Shyong Tsai ; Ming-Hsiung Tsai ; Heng-Yu Kung ; Shen-Li Chen ; Jing, M.H. ; Wen-Kuan Yeh
義守大學	2008/04/27	Effect of crystal-originated particles (COPs) on ULSI process integrity	Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. ; Wen-Kuan Yeh
義守大學	2008-10	Elucidating the effects of current stress history on reliability characteristics by dynamic analysis	Po-Ying Chen;Shen-Li Chen;Ming-Hsiung Tsai;Wen-Kuan Yeh;Heng-Yu Kung;YuKon Chang
義守大學	2008-02	Reliability and characteristics of wafer-level chip-scale packages under current stress	Po-Ying Chen;Heng-Yu Kung;Yi-Shao Lai;Ming Hsiung Tsai;Wen-Kuan Yeh
國立高雄師範大學	2008	A 1.2V Low-Power CMOS Voltage-Controlled Oscillator (VCO) Using Current-Reused Configuration with Balanced Resistors for IEEE 802.16e	Ruey-Lue Wang;Hsuan-Der Yen;Wen-Kuan Yeh;Yi-Jiue Shie; 王瑞祿
國立高雄師範大學	2007-12	2~10GHz UWB Low Noise Amplifier Using a Cascode Structure with Resistive Shunt Feedback	Ruey-Lue Wang;Yen-Chin Chen;Wen-Kuan Yeh;Hsuan-Der Yen; 王瑞祿
義守大學	2006/12/06	The effect of stressing history in reliability characteristics	Po-Ying Chen ; Heng-Yu Kung ; Yi-Shao Lai ; Wen-Kuan Yeh

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