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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 國立交通大學 |
2018-08-21T05:52:54Z |
Effect of dose loss of phosphorus on capacitance-voltage characteristics of n-type poly-Si junctionless thin-film transistors
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Tsai, Jung-Ruey; Wen, Ting-Ting; Lin, Horng-Chih |
| 國立交通大學 |
2017-04-21T06:49:47Z |
Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD Stress
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Tsai, Jung-Ruey; Wen, Ting-Ting; Yang, Shao-Ming; Sheu, Gene; Chang, Ruey-Dar; Syu, Yi-Jhen; Liu, Chin-Ping; Chang, Hsiu-Fu; Wei, Zhao-Hui |
| 國立交通大學 |
2017-04-21T06:49:44Z |
Comparison of Electrical Characteristics of N-type Silicon Junctionless Transistors with and without Film Profile Engineering by TCAD Simulation
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Tsai, Jung-Ruey; Lin, Horng-Chih; Chang, Hsiu-Fu; Shie, Bo-Shiuan; Wen, Ting-Ting; Huang, Tiao-Yuan |
| 國立交通大學 |
2017-04-21T06:48:27Z |
ENGINEERED THRESHOLD VOLTAGE IN ALGAN/GAN HEMTS FOR NORMALLY-OFF OPERATION
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Tsai, Jung-Ruey; Chang, Yi-Sheng; Wei, Kuo-Shu; Wen, Ting-Ting |
| 亞洲大學 |
2015-06 |
Reliability Analysis of Amorphous Silicon Thin-Film Transistors during Accelerated ESD stress
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蔡宗叡;TSAI, JUNG-RUEY;楊紹明;Yang, Shao-Ming;許健;Sheu, Gene;Cha, Ruey Dar;Chang, Ruey Dar;We, Ting Ting;Wen, Ting Ting |
| 亞洲大學 |
2015-02 |
ENGINEERED THRESHOLD VOLTAGE IN ALGAN/GAN HEMTS FOR NORMALLY-OFF OPERATION
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蔡宗叡;TSAI, JUNG-RUEY;Cha, Yi-Sheng;Chang, Yi-Sheng;Wei, Kuo-Shu;Wei, Kuo-Shu;We, Ting-Ting;Wen, Ting-Ting |
| 淡江大學 |
2014 |
應用無尺度網路模型於台灣商業銀行作業風險之評估
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溫婷婷; Wen, Ting-Ting |
Showing items 1-7 of 7 (1 Page(s) Totally)
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