|
English
|
正體中文
|
简体中文
|
总笔数 :0
|
|
造访人次 :
51823178
在线人数 :
703
教育部委托研究计画 计画执行:国立台湾大学图书馆
|
|
|
"weng wu te"的相关文件
显示项目 1-4 / 4 (共1页)
1
每页显示[10|25|50]项目
| 國立交通大學 |
2019-04-02T05:59:31Z |
A comparison of plasma-induced damage on the reliability between high-k/metal-gate and SiO2/poly-gate complementary metal oxide semiconductor technology
|
Weng, Wu-Te; Lee, Yao-Jen; Lin, Horng-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-12T03:03:03Z |
電漿製程導致先進互補式金氧半場效電晶體可靠度損壞之研究
|
翁武得; Weng, Wu-Te; 黃調元; 林鴻志; Huang, Tiao-Yuan; Lin, Horng-Chih |
| 國立交通大學 |
2014-12-08T15:09:04Z |
Effects of Plasma Damage on Metal-insulator-Metal Capacitors and Transistors for Advanced Mixed-Signal/Radio-Frequency Metal-Oxide-Semiconductor Field-Effect Transistor Technology
|
Weng, Wu-Te; Lee, Yao-Jen; Lin, Hong-Chih; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:07:08Z |
A comparison of plasma-induced damage on the reliability between high-k/metal-gate and SiO(2)/poly-gate complementary metal oxide semiconductor technology
|
Weng, Wu-Te; Lee, Yao-Jen; Lin, Horng-Chih; Huang, Tiao-Yuan |
显示项目 1-4 / 4 (共1页)
1
每页显示[10|25|50]项目
|
