臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立高雄師範大學	2012-08	Reliability Improvement of 28nm High-k/Metal Gate-Last MOSFET using Appropriate Oxygen Annealing	Yi-Lin Yang;Wenqi Zhang;Chi-Yun Cheng;Yi-Ping Huang;Pin-Tseng Chen;Chia-Wei Hsu;Li-Kong Chin;Chien-Ting Lin;Che-Hua Hsu;Chien-Ming Lai ;Wen-Kuan Yeh; 楊宜霖
國立高雄師範大學	2012-06	Reliability Improvement of 28nm High-k/Metal Gate Device by Using Oxygen Annealing	Yi-Lin Yang;Wenqi Zhang;Chi-Yun Cheng;Yi-Ping Huang;Pin-Tseng Chen;Li-Kong Chin;Chia-Wei Hsu;Wen-Kuan Yeh; 楊宜霖
國立高雄師範大學	2012	The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions	Yi-Lin Yang;Wenqi Zhang;Chi-Yun Cheng;Wen-Kuan Yeh; 楊宜霖

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