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| 臺大學術典藏 |
2018-09-10T09:48:16Z |
EUV degradation of high performance Ge MOSFETs
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Chang, H.-C.; Wong, I.-S.; Lin, C.-M.; Sun, H.-C.; Ciou, H.-J.; Yeh, W.-T.; Lo, S.-J.; Liu, C.W.; Hu, C.; Yang, F.-L.; Chen, Y.-T.; CHEE-WEE LIU et al. |
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