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Showing items 1-9 of 9  (1 Page(s) Totally)
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Institution Date Title Author
國立成功大學 2016-03-21 Disruption of crystalline structure of Sn3.5Ag induced by electric current Huang, Han-Chie; Lin, Kwang-Lung; Wu, Albert T.
國立成功大學 2015-12-01 High dislocation density of tin induced by electric current Liao, Yi-Han; Liang, Chien-Lung; Lin, Kwang-Lung; Wu, Albert T.
國立成功大學 2015-10 In Situ Synchrotron X-ray Diffraction Measurement of the Strain Distribution in Si Die for the Embedded Substrates Hsu, Hsueh Hsien; Chen, Hao; Ouyang, Yao Tsung; Chiu, Tz Cheng; Chang, Tao Chih; Lee, Hsin Yi; Ku, Chin Shun; Wu, Albert T.
國立成功大學 2015-01-15 The diminishing of crystal structure of Sn9Zn alloy due to electrical current stressing He, Jian-Yang; Lin, Kwang-Lung; Wu, Albert T.
國立交通大學 2014-12-08T15:14:37Z Stress analysis of spontaneous Sn whisker growth Tu, K. N.; Chen, Chih; Wu, Albert T.
國立成功大學 2014-01 Evaluation of Strain Measurement in a Die-to-Interposer Chip Using In Situ Synchrotron X-Ray Diffraction and Finite-Element Analysis Hsu, Hsueh-Hsien; Chiu, Tz-Cheng; Chang, Tao-Chih; Huang, Shin-Yi; Lee, Hsin-Yi; Ku, Ching-Shun; Lin, Yang-Yi; Su, Chien-Hao; Chou, Li-Wei; Ouyang, Yao-Tsung; Huang, Yi-Ting; Wu, Albert T.
國立成功大學 2013-03 Anisotropic dissolution behavior of the second phase in SnCu solder alloys under current stress Chen, Wei-Yu; Chiu, Tsung-Chieh; Lin, Kwang-Lung; Wu, Albert T.; Jang, Wei-Luen; Dong, Chung-Li; Lee, Hsin-Yi
國立成功大學 2013-02-05 Electrorecrystallization of Metal Alloy Chiu, Ying-Ta; Lin, Kwang-Lung; Wu, Albert T.; Jang, Wei-Luen; Dong, Chung-Li; Lai, Yi-Shao
國立臺灣大學 2007 Electromigration in the Flip Chip Solder Joint of Sn-8Zn-3Bi on Copper Pads Lin, W.H.; Wu, Albert T.; Lin, S.Z.; Chuang, T.H.; Tu, K.N.

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