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Showing items 1-14 of 14  (1 Page(s) Totally)
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Institution Date Title Author
國立高雄第一科技大學 2017-07-13 利用卷積神經網絡及大尺寸圖像拼接技術於畫作風格模擬之研究 吳?維; WU, CHI-WEI
真理大學 2017 中國股市的投資策略與超額報酬分析 吳祺葦; WU,CHI-WEI
國立交通大學 2015-11-26T01:07:54Z 利用大氣電漿技術沉積不同結晶性硒薄膜於堆疊金屬前驅層之硒化製程研究 吳致緯; Wu, Chi-Wei; 張國明; Chang, Kow-Ming
中山醫學大學 2015 探討??化合物對子宮內膜癌細胞株之腫瘤抑制機轉 吳冀威; Wu, Chi-Wei
國立交通大學 2014-12-12T01:55:11Z Hf1-xZrXO2/Metal Gate之P型金氧半場效電晶體電性分析與施加動態正負偏壓劣化研究 吳啓維; Wu, Chi-Wei; 施敏; 張鼎張; Sze, Simon M.; Chang, Ting-Chang
國立交通大學 2014-12-08T15:32:49Z Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate Stacks Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Chen, Daniel; Sze, Simon M.
國立交通大學 2014-12-08T15:30:09Z Structural and optoelectronic properties of GZO/SiOx bilayer films by atmosphere pressure plasma jet Chang, Kow-Ming; Ho, Po-Ching; Wu, Chi-Wei; Wu, Chin-Jyi; Chang, Chia-Chiang
國立交通大學 2014-12-08T15:29:13Z Investigation of an anomalous hump in gate current after negative-bias temperature-instability in HfO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Guan-Ru; Chen, Hua-Mao; Lu, Ying-Shin; Wang, Bin-Wei; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M.
國立交通大學 2014-12-08T15:28:51Z Analysis of anomalous traps measured by charge pumping technique in HfO2/metal gate n-channel metal-oxide-semiconductor field-effect transistors Ho, Szu-Han; Chang, Ting-Chang; Lu, Ying-shin; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Wu, Chi-Wei; Luo, Hung-Ping; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M.
國立交通大學 2014-12-08T15:24:05Z Analysis of an anomalous hump in gate current after dynamic negative bias stress in HfxZr1-xO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Luo, Hung-Ping; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M.
國立成功大學 2013 Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate Stacks Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Chen, Daniel; Sze, Simon M.
國立高雄餐旅大學 2012 從內部品牌化觀點探討影響員工品牌行為之研究 吳啟維; Wu, Chi-Wei
國立高雄第一科技大學 2011/07/21 電腦輔助主軸系統設計之研究 吳啟瑋; Wu Chi-Wei
朝陽科技大學 2008-12-31 植基於直方圖修改之無失真資訊隱藏研究 吳啟瑋; Wu, Chi-wei

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