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Showing items 1-14 of 14 (1 Page(s) Totally)
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| 國立高雄第一科技大學 |
2017-07-13 |
利用卷積神經網絡及大尺寸圖像拼接技術於畫作風格模擬之研究
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吳?維; WU, CHI-WEI |
| 真理大學 |
2017 |
中國股市的投資策略與超額報酬分析
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吳祺葦; WU,CHI-WEI |
| 國立交通大學 |
2015-11-26T01:07:54Z |
利用大氣電漿技術沉積不同結晶性硒薄膜於堆疊金屬前驅層之硒化製程研究
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吳致緯; Wu, Chi-Wei; 張國明; Chang, Kow-Ming |
| 中山醫學大學 |
2015 |
探討??化合物對子宮內膜癌細胞株之腫瘤抑制機轉
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吳冀威; Wu, Chi-Wei |
| 國立交通大學 |
2014-12-12T01:55:11Z |
Hf1-xZrXO2/Metal Gate之P型金氧半場效電晶體電性分析與施加動態正負偏壓劣化研究
|
吳啓維; Wu, Chi-Wei; 施敏; 張鼎張; Sze, Simon M.; Chang, Ting-Chang |
| 國立交通大學 |
2014-12-08T15:32:49Z |
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate Stacks
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Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Chen, Daniel; Sze, Simon M. |
| 國立交通大學 |
2014-12-08T15:30:09Z |
Structural and optoelectronic properties of GZO/SiOx bilayer films by atmosphere pressure plasma jet
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Chang, Kow-Ming; Ho, Po-Ching; Wu, Chi-Wei; Wu, Chin-Jyi; Chang, Chia-Chiang |
| 國立交通大學 |
2014-12-08T15:29:13Z |
Investigation of an anomalous hump in gate current after negative-bias temperature-instability in HfO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors
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Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Liu, Guan-Ru; Chen, Hua-Mao; Lu, Ying-Shin; Wang, Bin-Wei; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M. |
| 國立交通大學 |
2014-12-08T15:28:51Z |
Analysis of anomalous traps measured by charge pumping technique in HfO2/metal gate n-channel metal-oxide-semiconductor field-effect transistors
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Ho, Szu-Han; Chang, Ting-Chang; Lu, Ying-shin; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Wu, Chi-Wei; Luo, Hung-Ping; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M. |
| 國立交通大學 |
2014-12-08T15:24:05Z |
Analysis of an anomalous hump in gate current after dynamic negative bias stress in HfxZr1-xO2/metal gate p-channel metal-oxide-semiconductor field-effect transistors
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Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Luo, Hung-Ping; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Sze, Simon M. |
| 國立成功大學 |
2013 |
Anomalous Gate Current Hump after Dynamic Negative Bias Stress and Negative-Bias Temperature-Instability in p-MOSFETs with HfxZr1-xO2 and HfO2/Metal Gate Stacks
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Ho, Szu-Han; Chang, Ting-Chang; Wu, Chi-Wei; Lo, Wen-Hung; Chen, Ching-En; Tsai, Jyun-Yu; Chen, Hua-Mao; Liu, Guan-Ru; Tseng, Tseung-Yuen; Cheng, Osbert; Huang, Cheng-Tung; Chen, Daniel; Sze, Simon M. |
| 國立高雄餐旅大學 |
2012 |
從內部品牌化觀點探討影響員工品牌行為之研究
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吳啟維; Wu, Chi-Wei |
| 國立高雄第一科技大學 |
2011/07/21 |
電腦輔助主軸系統設計之研究
|
吳啟瑋; Wu Chi-Wei |
| 朝陽科技大學 |
2008-12-31 |
植基於直方圖修改之無失真資訊隱藏研究
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吳啟瑋; Wu, Chi-wei |
Showing items 1-14 of 14 (1 Page(s) Totally)
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