|
English
|
正體中文
|
简体中文
|
总笔数 :2852366
|
|
造访人次 :
44973268
在线人数 :
1540
教育部委托研究计画 计画执行:国立台湾大学图书馆
|
|
|
"wu chien wei"的相关文件
显示项目 6-15 / 97 (共10页)
1 2 3 4 5 6 7 8 9 10 > >>
每页显示[10|25|50]项目
| 國立臺灣海洋大學 |
2016 |
Photoassisted photoluminescence fine-tuning of gold nanodots through free radical-mediated ligand-assembly
|
Tseng, Yu-Ting; Cherng, Rochelle; Harroun, Scott G.; Yuan, Zhiqin; Lin, Tai-Yuan; Wu, Chien-Wei; Chang, Huan-Tsung; Huang, Chih-Ching |
| 淡江大學 |
2016 |
Efficient Method for Testing the Batch-Processing Process Yield
|
Liao, Mou-Yuan;Wu, Chien-Wei |
| 國立臺灣海洋大學 |
2015 |
合成氧化銅與氧化錳奈米材料應用於奈米仿生酵素與超級電容
|
Wu, Chien-Wei; 吳建緯 |
| 國立交通大學 |
2014-12-08T15:48:38Z |
Estimating and testing process accuracy with extension to asymmetric tolerances
|
Wu, Chien-Wei; Shu, Ming-Hung; Pearn, W. L.; Tai, Yi-Chang |
| 國立交通大學 |
2014-12-08T15:20:49Z |
Two Tests for Supplier Selection Based on Process Yield
|
Pearn, W. L.; Liao, Mou-Yuan; Wu, Chien-Wei; Chu, Yao-Tsung |
| 國立交通大學 |
2014-12-08T15:16:25Z |
Multiple-process performance analysis chart based on process loss indices
|
Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:33Z |
Bayesian approach for measuring EEPROM process capability based on the one-sided indices C-PU and C-PL
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立交通大學 |
2014-12-08T15:15:20Z |
Measuring process performance based on expected loss with asymmetric tolerances
|
Pearn, W. L.; Chang, Y. C.; Wu, Chien-Wei |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Accuracy analysis of the percentile method for estimating non normal manufacturing quality
|
Wu, Chien-Wei; Pearn, W. L.; Chang, C. S.; Chen, H. C. |
| 國立交通大學 |
2014-12-08T15:15:01Z |
On the sampling distributions of the estimated process loss indices with asymmetric tolerances
|
Chang, Y. C.; Pearn, W. L.; Wu, Chien-Wei |
显示项目 6-15 / 97 (共10页)
1 2 3 4 5 6 7 8 9 10 > >>
每页显示[10|25|50]项目
|
