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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"wu chien wei"的相關文件
顯示項目 86-95 / 97 (共10頁)
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| 國立臺灣科技大學 |
2005 |
A multivariate EWMA control chart for monitoring process variability with individual observations
|
Yeh, ArthurB. ; Huwang, Longcheen; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing
|
Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H. |
| 國立臺灣科技大學 |
2005 |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2005 |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples
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Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C. |
| 國立臺灣科技大學 |
2005 |
An effective modern approach for measuring high-tech product manufacturing process quality
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Process capability assessment for index Cpk based on Bayesian approach
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability testing based on Cpm with multiple samples
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2004 |
Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes
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Pearn, W. L. ; Wu, Chien-Wei; Lin, H. C. |
| 國立臺灣科技大學 |
2004 |
Quality-yield measure for production with very low fraction of defectives
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
顯示項目 86-95 / 97 (共10頁)
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