| 國立臺灣科技大學 |
2010 |
Measuring process performance based on Taguchi capability index in the presence of measurement errors
|
Wu, Chien-Wei |
| 國立臺灣科技大學 |
2010 |
Decision rules on process capability testing for asymmetric tolerances
|
Chang, Y. C. ; Wu, Chien-Wei |
| 國立政治大學 |
2010 |
山中百合花:原住民生涯復元之敘事研究
|
吳健瑋; Wu, Chien Wei |
| 國立臺灣科技大學 |
2009 |
Decision-making in testing process performance with fuzzy data
|
Wu, Chien-Wei |
| 國立臺灣科技大學 |
2009 |
Estimating and testing process yield with imprecise data
|
Wu, Chien-Wei; Liao, M. Y. |
| 國立臺灣科技大學 |
2009 |
An overview of theory and practice on process capability indices for quality assurance
|
Wu, Chien-Wei; Pearn, W. L. ; Kotz, S. |
| 國立臺灣科技大學 |
2009 |
A Bayesian procedure for assessing process performance based on the third generation capability index
|
Wu, Chien-Wei; Lin, T. Y. |
| 國立臺灣科技大學 |
2009 |
A comparison of methods for estimating loss-based capability index
|
Wu, Chien-Wei; Shu, M. H. ; Pearn, W. L. ; Cheng, F. T. |
| 國立臺灣科技大學 |
2009 |
Generalized confidence intervals for assessing process capability of multiple production lines
|
Wu, Chien-Wei; Shu, M. H. ; Cheng, F. T. |
| 國立臺灣科技大學 |
2009 |
Implementation and power analysis of a supplier selection method
|
Wu, Chien-Wei |
| 國立臺灣科技大學 |
2009 |
Decision making in testing process capability for asymmetric tolerances based on Bayesian approach
|
Wu, Chien-Wei; Chang, Y. C. |
| 國立臺灣科技大學 |
2009 |
Evaluation of process capability index for non-normal distributions
|
Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣大學 |
2009 |
次級房貸風暴對於各國信用市場與股市及匯市間之關聯性的影響
|
吳建緯; Wu, Chien-Wei |
| 東吳大學 |
2008 |
以FuzzyAHP探討企業導入RFID系統之評估準則
|
吳建緯; Wu, Chien-wei |
| 淡江大學 |
2008 |
休旅車休閒族群消費與消費後相關行為之研究
|
吳建衛; Wu, Chien-wei |
| 國立臺灣科技大學 |
2008 |
A hypothesis testing procedure on assessing process performance for asymmetric tolerances
|
Wu, Chien-Wei; Chang, Y. C. |
| 國立臺灣科技大學 |
2008 |
Assessing process capability based on Bayesian approach with subsamples
|
Wu, Chien-Wei |
| 國立臺灣科技大學 |
2008 |
A variables sampling plan based on Cpmk for product acceptance determination
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2008 |
Assessing process capability based on the lower confidence bound of Cpk for asymmetric tolerances
|
Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2008 |
Bootstrap approach for supplier selection based on production yield
|
Wu, Chien-Wei; Shu, M. H. ; Pearn, W. L. ; Liu, K. H. |
| 國立臺灣科技大學 |
2008 |
A fuzzy approach to evaluate process performance based on imprecise data
|
Wu, Chien-Wei; Kuo, N. C. |
| 國立臺灣科技大學 |
2008 |
Generalized confidence intervals for the process capability index Cpm
|
Hsu, B. M. ; Wu, Chien-Wei; Shu, M. H. |
| 國立臺灣科技大學 |
2008 |
Asymmetric Process Capability Assessment for Index Cpmk based on Bayesian Approach
|
Lin, T. Y. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2008 |
Generalized confidence intervals for comparing the capability of two processes
|
Wu, Chien-Wei; Huang, P. H. |
| 國立臺灣科技大學 |
2008 |
A Bayesian approach for assessing capability index Cpmk
|
Lin, T. Y. ; Wu, Chien-Wei. |
| 國立臺灣科技大學 |
2007 |
Accuracy analysis of the percentile method for estimating non-normal manufacturing quality
|
Wu, Chien-Wei; Pearn, W. L. ; Chang, C. S. ; Chen, H. C. |
| 國立臺灣科技大學 |
2007 |
On the sampling distributions of the estimated process loss indices with asymmetric tolerances
|
Chang, Y. C. ; Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
An alternative approach to test process capability for unilateral specification with subsamples
|
Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
A Bayesian procedure for assessing process performance based on expected relative loss with asymmetric tolerances
|
Wu, Chien-Wei; Shu, M. H. |
| 國立臺灣科技大學 |
2007 |
Monitoring multivariate process variability for individual observations
|
Huwang, Longcheen; Yeh, ArthurB. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
An effective decision making method for product acceptance
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
Accuracy in Estimating Process Capability Analysis
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2007 |
Reliability Monitoring and Performance Measuring for the Exponential Failure Process
|
Wu, Chien-Wei; Yang, C. S. ; Shu, M. H. |
| 國立臺灣科技大學 |
2006 |
Production quality and yield assurance for processes with multiple independent characteristics
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Quality yield measure for processes with asymmetric tolerances
|
Pearn, W. L. ; Lin, P. C. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Bayesian approach for measuring EEPROM process capability based on the one-sided indices CPU and CPL
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2006 |
Tool replacement for production with a low fraction of defectives
|
Pearn, W. L. ; Hsu, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Multi-process performance analysis chart based on process loss indices
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Measuring process performance based on expected loss for asymmetric tolerances
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Variables sampling plans with PPM fraction of defectives and process loss consideration
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Process Capability Measure for Asymmetric Tolerances (in English)
|
Chang, Y. C. ; Wu, Chien-Wei |
| 元培科技大學 |
2006 |
Tool Replacement for Production with Low Fraction Defective,
|
Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei |
| 國立臺灣大學 |
2006 |
最適通路與促銷策略組合之研究
|
吳建緯; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
A Bayesian approach for assessing process precision based on multiple samples
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
A multivariate EWMA control chart for monitoring process variability with individual observations
|
Yeh, ArthurB. ; Huwang, Longcheen; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing
|
Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H. |
| 國立臺灣科技大學 |
2005 |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2005 |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples
|
Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C. |