| 國立臺灣科技大學 |
2006 |
Bayesian approach for measuring EEPROM process capability based on the one-sided indices CPU and CPL
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2006 |
Tool replacement for production with a low fraction of defectives
|
Pearn, W. L. ; Hsu, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Multi-process performance analysis chart based on process loss indices
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Measuring process performance based on expected loss for asymmetric tolerances
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Variables sampling plans with PPM fraction of defectives and process loss consideration
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2006 |
Process Capability Measure for Asymmetric Tolerances (in English)
|
Chang, Y. C. ; Wu, Chien-Wei |
| 元培科技大學 |
2006 |
Tool Replacement for Production with Low Fraction Defective,
|
Pearn, W. L.; Hsu, Ya Chen ; Wu, Chien-Wei |
| 國立臺灣大學 |
2006 |
最適通路與促銷策略組合之研究
|
吳建緯; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
A Bayesian approach for assessing process precision based on multiple samples
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
A multivariate EWMA control chart for monitoring process variability with individual observations
|
Yeh, ArthurB. ; Huwang, Longcheen; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing
|
Pearn, W. L. ; Wu, Chien-Wei; Wang, K. H. |
| 國立臺灣科技大學 |
2005 |
Measuring manufacturing capability for couplers and wavelength division multiplexers
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2005 |
Bootstrap approach for estimating process quality yield with application to light emitting diodes
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Procedures for testing manufacturing precision Cp based on (Xbar, R) or (Xbar, S) control chart samples
|
Pearn, W. L. ; Wu, Chien-Wei; Chuang, H. C. |
| 國立臺灣科技大學 |
2005 |
An effective modern approach for measuring high-tech product manufacturing process quality
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Process capability assessment for index Cpk based on Bayesian approach
|
Pearn, W. L. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2005 |
Capability testing based on Cpm with multiple samples
|
Wu, Chien-Wei; Pearn, W. L. |
| 國立臺灣科技大學 |
2004 |
Procedure for supplier selection based on Cpm applied to super twisted nematic liquid crystal display processes
|
Pearn, W. L. ; Wu, Chien-Wei; Lin, H. C. |
| 國立臺灣科技大學 |
2004 |
Quality-yield measure for production with very low fraction of defectives
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 國立臺灣科技大學 |
2004 |
Distributional and inferential properties of the process loss indices
|
Pearn, W. L. ; Chang, Y. C. ; Wu, Chien-Wei |
| 東吳大學 |
1993 |
訊息不對稱情形下的參進障礙─極限價格分析
|
吳健瑋; Wu, Chien-Wei |
