|
English
|
正體中文
|
简体中文
|
总笔数 :0
|
|
造访人次 :
51815714
在线人数 :
1026
教育部委托研究计画 计画执行:国立台湾大学图书馆
|
|
|
"wu cy"的相关文件
显示项目 376-385 / 607 (共61页)
<< < 33 34 35 36 37 38 39 40 41 42 > >>
每页显示[10|25|50]项目
| 國立交通大學 |
2014-12-08T15:04:22Z |
THE DESIGN OF FULLY DIFFERENTIAL CMOS OPERATIONAL-AMPLIFIERS WITHOUT EXTRA COMMON-MODE FEEDBACK-CIRCUITS
|
LU, PH; WU, CY; TSAI, MK |
| 國立交通大學 |
2014-12-08T15:04:20Z |
A NOVEL PHL-EMITTER BIPOLAR-TRANSISTOR - FABRICATION AND CHARACTERIZATION
|
CHANG, KZ; WU, CY |
| 國立交通大學 |
2014-12-08T15:04:12Z |
NOVEL CHARACTERISTICS OF THE POLYSILICON HIGH-LOW-EMITTER (PHL-EMITTER) BIPOLAR-TRANSISTOR HIGH-CURRENT GAIN AND ZERO ACTIVATION-ENERGY
|
CHANG, KZ; WU, CY |
| 國立交通大學 |
2014-12-08T15:04:11Z |
CMOS ON-CHIP ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT USING 4-SCR STRUCTURES WITH LOW ESD-TRIGGER VOLTAGE
|
KER, MD; WU, CY |
| 國立交通大學 |
2014-12-08T15:04:09Z |
TRANSIENT ANALYSIS OF SUBMICRON CMOS LATCHUP WITH A PHYSICAL CRITERION
|
KER, MD; WU, CY |
| 國立交通大學 |
2014-12-08T15:04:09Z |
A CHARACTERIZATION TECHNIQUE FOR THE DEGRADATION CHARACTERISTICS OF TI/SI SCHOTTKY-BARRIER DIODES AND OHMIC CONTACTS AFTER THERMAL SILICIDATION
|
LOU, YS; WU, CY |
| 國立交通大學 |
2014-12-08T15:04:08Z |
COMPARATIVE-STUDIES OF GD-ORDERING IN VARIOUS CUPRATE SYSTEMS
|
HO, JC; WU, CY; LAI, CC; SHIEH, JH; KU, HC |
| 國立交通大學 |
2014-12-08T15:04:08Z |
MAGNETIC-BEHAVIOR IN PR-CONTAINING TL-BASED AND PB-BASED CUPRATES
|
KU, HC; LAI, CC; SHIEH, JH; LIOU, JW; WU, CY; HO, JC |
| 國立交通大學 |
2014-12-08T15:04:02Z |
A SELF-CONSISTENT CHARACTERIZATION METHODOLOGY FOR SCHOTTKY-BARRIER DIODES AND OHMIC CONTACTS
|
LOU, YS; WU, CY |
| 國立交通大學 |
2014-12-08T15:03:57Z |
NEW DESIGN METHODOLOGY AND NEW DIFFERENTIAL LOGIC-CIRCUITS FOR THE IMPLEMENTATION OF TERNARY LOGIC SYSTEMS IN CMOS-VLSI WITHOUT PROCESS MODIFICATION
|
HUANG, HY; WU, CY |
显示项目 376-385 / 607 (共61页)
<< < 33 34 35 36 37 38 39 40 41 42 > >>
每页显示[10|25|50]项目
|
