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"wu cy"
Showing items 311-335 of 607 (25 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:06:09Z |
CORRELATIONS BETWEEN CMOS LATCH-UP CHARACTERISTICS AND SUBSTRATE STRUCTURE PARAMETERS
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CHEN, MJ; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:08Z |
A NEW OXIDATION-RESISTANT SELF-ALIGNED TISI2 PROCESS
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TSENG, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:07Z |
A CHARACTERIZATION MODEL FOR CONSTANT CURRENT STRESSED VOLTAGE-TIME CHARACTERISTICS OF THIN THERMAL OXIDES GROWN ON SILICON SUBSTRATE
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CHEN, CF; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:06Z |
THE ANALYSIS AND DESIGN OF CMOS MULTIDRAIN LOGIC AND STACKED MULTIDRAIN LOGIC
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WU, CY; WANG, JS; TSAI, MK |
| 國立交通大學 |
2014-12-08T15:06:06Z |
A SIMPLE TECHNIQUE FOR MEASURING THE INTERFACE-STATE DENSITY OF THE SCHOTTKY-BARRIER DIODES USING THE CURRENT-VOLTAGE CHARACTERISTICS
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TSENG, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:05Z |
THE DISTORTION OF THE INTERFACE-STATE SPECTRUM DUE TO NONEQUILIBRIUM OCCUPANCY OF THE INTERFACE STATES AT THE METAL-SEMICONDUCTOR INTERFACE
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TSENG, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:05Z |
THE EFFECTS OF THERMAL NITRIDATION CONDITIONS ON THE RELIABILITY OF THIN NITRIDED OXIDE-FILMS
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TSAI, HH; WU, LC; WU, CY; HU, CM |
| 國立交通大學 |
2014-12-08T15:06:05Z |
A NEW STRUCTURE-ORIENTED MODEL FOR WELL RESISTANCE IN CMOS LATCHUP STRUCTURES
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CHEN, MJ; SZE, SC; CHEN, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:05Z |
A SIMPLE INTERFACIAL-LAYER MODEL FOR THE NONIDEAL IV AND C-V CHARACTERISTICS OF THE SCHOTTKY-BARRIER DIODE
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TSENG, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:04Z |
AN ANALYTIC IV MODEL FOR LIGHTLY DOPED DRAIN (LDD) MOSFET DEVICES
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HUANG, GS; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:04Z |
SUPERIOR CHARACTERISTICS OF THERMAL OXIDE LAYERS GROWN ON AMORPHOUS-SILICON FILMS
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WU, CY; CHEN, CF |
| 國立交通大學 |
2014-12-08T15:06:03Z |
A NEW APPROACH TO ANALYTICALLY SOLVING THE TWO-DIMENSIONAL POISSON EQUATION AND ITS APPLICATION IN SHORT-CHANNEL MOSFET MODELING
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LIN, PS; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:03Z |
A SIMPLIFIED COMPUTER-ANALYSIS FOR NORMAL-WELL GUARD RING EFFICIENCY IN CMOS CIRCUITS
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CHEN, MJ; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:03Z |
THE DIELECTRIC RELIABILITY OF INTRINSIC THIN SIO2-FILMS THERMALLY GROWN ON A HEAVILY DOPED SI SUBSTRATE - CHARACTERIZATION AND MODELING
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CHEN, CF; WU, CY; LEE, MK; CHEN, CN |
| 國立交通大學 |
2014-12-08T15:06:03Z |
TRANSPORT-PROPERTIES OF THERMAL OXIDE-FILMS GROWN ON POLYCRYSTALLINE SILICON - MODELING AND EXPERIMENTS
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WU, CY; CHEN, CF |
| 國立交通大學 |
2014-12-08T15:06:01Z |
THE EFFECTS OF THERMAL SILICIDATION ON THE CURRENT TRANSPORT CHARACTERISTICS OF TI/(111)SI SCHOTTKY-BARRIER CONTACTS
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TSENG, HH; WU, CY |
| 國立交通大學 |
2014-12-08T15:06:00Z |
A NEW METHOD FOR DETERMINING THE TERMINAL SERIES RESISTANCES AND HIGH-INJECTION COEFFICIENT OF BIPOLAR-TRANSISTORS IN CMOS INTEGRATED-CIRCUITS FOR COMPUTER-AIDED CIRCUIT MODELING
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YANG, YH; WU, CY; CHEN, WY |
| 國立交通大學 |
2014-12-08T15:06:00Z |
GENERAL EXPERIMENTAL-METHOD OF PARAMETER EXTRACTION FOR CMOS TIMING MACROMODELS
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WU, CY; JANG, WY; WU, HJ |
| 國立交通大學 |
2014-12-08T15:05:59Z |
INTEGRAL-EQUATION SOLUTION FOR HYPERBOLIC HEAT-CONDUCTION WITH SURFACE RADIATION
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WU, CY |
| 國立交通大學 |
2014-12-08T15:05:59Z |
TIMING MACROMODELS FOR CMOS STATIC SET RESET LATCHES AND THEIR APPLICATIONS
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WU, CY; LI, C; HWANG, JS |
| 國立交通大學 |
2014-12-08T15:05:57Z |
A NEW EXPERIMENTAL-METHOD TO DETERMINE THE SATURATION VOLTAGE OF A SMALL-GEOMETRY MOSFET
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JANG, WY; WU, CY; WU, HJ |
| 國立交通大學 |
2014-12-08T15:05:57Z |
A NEW LATERAL GROWTH FREE FORMATION TECHNIQUE FOR TITANIUM SILICIDE USING THE SI/W/TI TRILAYER STRUCTURE
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LIN, MZ; WU, CY |
| 國立交通大學 |
2014-12-08T15:05:56Z |
LOW-POWER DYNAMIC TERNARY LOGIC
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WANG, JS; WU, CY; TSAI, MK |
| 國立交通大學 |
2014-12-08T15:05:55Z |
COBALT SILICIDE INTERCONNECTION FROM A SI/W/CO TRILAYER STRUCTURE
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LIN, MZ; WU, CY |
| 國立交通大學 |
2014-12-08T15:05:53Z |
NEW MONOLITHIC SWITCHED-CAPACITOR DIFFERENTIATORS WITH GOOD NOISE REJECTION
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WU, CY; YU, TC; CHANG, SS |
Showing items 311-335 of 607 (25 Page(s) Totally)
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