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Showing items 1-9 of 9  (1 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:30:22Z Charge Quantity Influence on Resistance Switching Characteristic During Forming Process Chu, Tian-Jian; Chang, Ting-Chang; Tsai, Tsung-Ming; Wu, Hsing-Hua; Chen, Jung-Hui; Chang, Kuan-Chang; Young, Tai-Fa; Chen, Kai-Hsang; Syu, Yong-En; Chang, Geng-Wei; Chang, Yao-Feng; Chen, Min-Chen; Lou, Jyun-Hao; Pan, Jhih-Hong; Chen, Jian-Yu; Tai, Ya-Hsiang; Ye, Cong; Wang, Hao; Sze, Simon M.
國立交通大學 2014-12-08T15:30:22Z Low Temperature Improvement Method on Zn:SiOx Resistive Random Access Memory Devices Chang, Kuan-Chang; Tsai, Tsung-Ming; Chang, Ting-Chang; Wu, Hsing-Hua; Chen, Kai-Huang; Chen, Jung-Hui; Young, Tai-Fa; Chu, Tian-Jian; Chen, Jian-Yu; Pan, Chih-Hung; Su, Yu-Ting; Syu, Yong-En; Tung, Cheng-Wei; Chang, Geng-Wei; Chen, Min-Chen; Huang, Hui-Chun; Tai, Ya-Hsiang; Gan, Der-Shin; Wu, Jia-Jie; Hu, Ying; Sze, Simon M.
國立交通大學 2014-12-08T15:29:51Z Characteristics and Mechanisms of Silicon-Oxide-Based Resistance Random Access Memory Chang, Kuan-Chang; Tsai, Tsung-Ming; Chang, Ting-Chang; Wu, Hsing-Hua; Chen, Jung-Hui; Syu, Yong-En; Chang, Geng-Wei; Chu, Tian-Jian; Liu, Guan-Ru; Su, Yu-Ting; Chen, Min-Chen; Pan, Jhih-Hong; Chen, Jian-Yu; Tung, Cheng-Wei; Huang, Hui-Chun; Tai, Ya-Hsiang; Gan, Der-Shin; Sze, Simon M.
國立交通大學 2014-12-08T15:13:37Z High-performance polycrystalline-silicon TFT by heat-retaining enhanced lateral crystallization Liu, Po-Tsun; Wu, Hsing-Hua
國立交通大學 2014-12-08T15:07:52Z Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan
國立交通大學 2014-12-08T15:06:55Z Temperature-dependent memory characteristics of silicon-oxide-nitride-oxide-silicon thin-film-transistors Chen, Shih-Ching; Chang, Ting-Chang; Wu, Yung-Chun; Chin, Jing-Yi; Syu, Yong-En; Sze, S. M.; Chang, Chun-Yen; Wu, Hsing-Hua; Chen, Yi-Chan
國立成功大學 2013-04 Low Temperature Improvement Method on Zn:SiOx Resistive Random Access Memory Devices Chang, Kuan-Chang; Tsai, Tsung-Ming; Chang, Ting-Chang; Wu, Hsing-Hua; Chen, Kai-Huang; Chen, Jung-Hui; Young, Tai-Fa; Chu, Tian-Jian; Chen, Jian-Yu; Pan, Chih-Hung; Su, Yu-Ting; Syu, Yong-En; Tung, Cheng-Wei; Chang, Geng-Wei; Chen, Min-Chen; Huang, Hui-Chun; Tai, Ya-Hsiang; Gan, Der-Shin; Wu, Jia-Jie; Hu, Ying; Sze, Simon M.
國立成功大學 2013-04 Charge Quantity Influence on Resistance Switching Characteristic During Forming Process Chu, Tian-Jian; Chang, Ting-Chang; Tsai, Tsung-Ming; Wu, Hsing-Hua; Chen, Jung-Hui; Chang, Kuan-Chang; Young, Tai-Fa; Chen, Kai-Hsang; Syu, Yong-En; Chang, Geng-Wei; Chang, Yao-Feng; Chen, Min-Chen; Lou, Jyun-Hao; Pan, Jhih-Hong; Chen, Jian-Yu; Tai, Ya-Hsiang; Ye, Cong; Wang, Hao; Sze, Simon M.
國立成功大學 2013-03 Characteristics and Mechanisms of Silicon-Oxide-Based Resistance Random Access Memory Chang, Kuan-Chang; Tsai, Tsung-Ming; Chang, Ting-Chang; Wu, Hsing-Hua; Chen, Jung-Hui; Syu, Yong-En; Chang, Geng-Wei; Chu, Tian-Jian; Liu, Guan-Ru; Su, Yu-Ting; Chen, Min-Chen; Pan, Jhih-Hong; Chen, Jian-Yu; Tung, Cheng-Wei; Huang, Hui-Chun; Tai, Ya-Hsiang; Gan, Der-Shin; Sze, Simon M.

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