|
|
???tair.name??? >
???browser.page.title.author???
|
"wu kuo ming"???jsp.browse.items-by-author.description???
Showing items 1-25 of 55 (3 Page(s) Totally)
1 2 3 > >>
View [10|25|50] records per page
| 國立彰化師範大學 |
2011 |
Influence of Asymmetric Disks on Control Over the Existence of Vortex in Submicrometer-scaled Permalloy Disks
|
Huang, Chao-Hsien; Wu, Kuo-Ming; Wang, Chih-Yi; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2011 |
Influence of Asymmetric Disks on Control over the Existence of Vortex in Submicrometer-scaled Permalloy Disks
|
Huang, Chao-Hsien; Wu, Kuo-Ming; Wang, Chih-Yi; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2010-06 |
Study of One-Side-Flat Edge on Vortex in Submicro-Scaled Permalloy Disks
|
Huang, Chao-Hsien; Yang, Cheng-Ta; Wu, Kuo-Ming; Wu, Tian-Chiuan; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2010-06 |
Study of One-Side-Flat Edge on Vortex in Submicro-Scaled Permalloy Disks
|
Huang, Chao-Hsien; Yang, Cheng-Ta; Wu, Kuo-Ming; Wu, Tian-Chiuan; Wu, Jong-Ching; Horng, Lance |
| 國立成功大學 |
2009-12 |
Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-11 |
Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors
|
Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-09 |
An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-04 |
Investigation of Hot-Carrier-Induced Degradation Mechanisms in p-Type High-Voltage Drain Extended Metal-Oxide-Semiconductor Transistors
|
Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2009-04 |
Mechanism and Modeling of On-Resistance Degradation in n-Type Lateral Diffused Metal-Oxide-Semiconductor Transistors
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-12-01 |
Channel length dependence of hot-carrier-induced degradation in n-type drain extended metal-oxide-semiconductor transistors
|
Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-09 |
On-resistance degradation induced by hot-carrier injection in LDMOS transistors with STI in the drift region
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-08 |
Dynamic turn-on mechanism of the n-MOSFET under high-current stress
|
Yang, Dao-Hong; Chen, Jone F.; Lee, Jian-Hsing; Wu, Kuo-Ming |
| 國立成功大學 |
2008-08 |
Mechanism and improvement of on-resistance degradation induced by avalanche breakdown in lateral DMOS transistors
|
Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. A. |
| 國立成功大學 |
2008-07-31 |
Gate current dependent hot-carrier-induced degradation in LDMOS transistors
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Huang, T. Y.; Liu, C. M. |
| 國立成功大學 |
2008-07 |
Effect of drift-region concentration on hot-carrier-induced R-on degradation in nLDMOS transistors
|
Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. M. |
| 國立成功大學 |
2008-06-16 |
Mechanism and lifetime prediction method for hot-carrier-induced degradation in lateral diffused metal-oxide-semiconductor transistors
|
Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Liu, C. M. |
| 國立彰化師範大學 |
2008-06 |
Influence of Asymmetry on Vortex Nucleation and Annihilation in Submicroscaled Permalloy Disk Array
|
Wu, Kuo-Ming; Horng, Lance; Wang, Jia-Feng; Wu, Jong-Ching; Wu, Yin-Hao; Lee, Ching-Ming |
| 國立成功大學 |
2008-05 |
Anomalous hot-caffier-induced increase in saturation-region drain current in n-type lateral diffused metal-oxide-semiconductor transistors
|
Chen, Shiang-Yu; Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Liu, C. M.; Hsu, S. L. |
| 國立成功大學 |
2008-04 |
An investigation on hot-carrier reliability and degradation index in lateral diffused metal-oxide-semiconductor field-effect transistors
|
Tian, Kuen-Shiuan; Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Lee, J. R.; Huang, Tsung-Yi; Liu, C. A.; Hsu, S. L. |
| 國立成功大學 |
2008-04 |
Effect of gate voltage on hot-carrier-induced on-resistance degradation in high-voltage n-type lateral diffused metal-oxide-semiconductor transistors
|
Chen, Shiang-Yu; Chen, Jone F.; Wu, Kuo-Ming; Lee, J. R.; Liu, C. A.; Hsu, S. L. |
| 國立成功大學 |
2008-03-17 |
Anomalous increase in hot-carrier-induced threshold voltage shift in n-type drain extended metal-oxide-semiconductor transistors
|
Chen, Jone F.; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. M. |
| 國立成功大學 |
2008-03-10 |
Effect of hot-carrier-induced interface states distribution on linear drain current degradation in 0.35 mu m n-type lateral diffused metal-oxide-semiconductor transistors
|
Lee, J. R.; Chen, Jone F.; Wu, Kuo-Ming; Liu, C. M.; Hsu, S. L. |
| 國立彰化師範大學 |
2008 |
Vortex Motion in Magnetic Disks with Different Geometric Asymmetry
|
Wu, Kuo-Ming; Wang, Jia-Feng; Wu, Yin-Hao; Lee, Ching-Ming; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2008 |
Influence of Asymmetry on Vortex Nucleation and Annihilation in Submicroscaled Permalloy Disk Array
|
Wu, Kuo-Ming; Horng, Lance; Wang, Jia-Feng; Wu, Jong-Ching; Wu, Yin-Hao; Lee, Ching-Ming |
| 國立彰化師範大學 |
2008 |
Vortex Motion in Magnetic Disks with Different Geometric Asymmetry
|
Wu, Kuo-Ming; Wang, Jia-Feng; Wu, Yin-Hao; Lee, Ching-Ming; Wu, Jong-Ching; Horng, Lance |
Showing items 1-25 of 55 (3 Page(s) Totally)
1 2 3 > >>
View [10|25|50] records per page
|
