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机构 日期 题名 作者
國立彰化師範大學 2011 Influence of Asymmetric Disks on Control Over the Existence of Vortex in Submicrometer-scaled Permalloy Disks Huang, Chao-Hsien; Wu, Kuo-Ming; Wang, Chih-Yi; Wu, Jong-Ching; Horng, Lance
國立彰化師範大學 2011 Influence of Asymmetric Disks on Control over the Existence of Vortex in Submicrometer-scaled Permalloy Disks Huang, Chao-Hsien; Wu, Kuo-Ming; Wang, Chih-Yi; Wu, Jong-Ching; Horng, Lance
國立彰化師範大學 2010-06 Study of One-Side-Flat Edge on Vortex in Submicro-Scaled Permalloy Disks Huang, Chao-Hsien; Yang, Cheng-Ta; Wu, Kuo-Ming; Wu, Tian-Chiuan; Wu, Jong-Ching; Horng, Lance
國立彰化師範大學 2010-06 Study of One-Side-Flat Edge on Vortex in Submicro-Scaled Permalloy Disks Huang, Chao-Hsien; Yang, Cheng-Ta; Wu, Kuo-Ming; Wu, Tian-Chiuan; Wu, Jong-Ching; Horng, Lance
國立成功大學 2009-12 Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth
國立成功大學 2009-11 Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth
國立成功大學 2009-09 An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth
國立成功大學 2009-04 Investigation of Hot-Carrier-Induced Degradation Mechanisms in p-Type High-Voltage Drain Extended Metal-Oxide-Semiconductor Transistors Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M.
國立成功大學 2009-04 Mechanism and Modeling of On-Resistance Degradation in n-Type Lateral Diffused Metal-Oxide-Semiconductor Transistors Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M.
國立成功大學 2008-12-01 Channel length dependence of hot-carrier-induced degradation in n-type drain extended metal-oxide-semiconductor transistors Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M.

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