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Taiwan Academic Institutional Repository >
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"wu kuo ming"
Showing items 1-10 of 55 (6 Page(s) Totally)
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| 國立彰化師範大學 |
2011 |
Influence of Asymmetric Disks on Control Over the Existence of Vortex in Submicrometer-scaled Permalloy Disks
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Huang, Chao-Hsien; Wu, Kuo-Ming; Wang, Chih-Yi; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2011 |
Influence of Asymmetric Disks on Control over the Existence of Vortex in Submicrometer-scaled Permalloy Disks
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Huang, Chao-Hsien; Wu, Kuo-Ming; Wang, Chih-Yi; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2010-06 |
Study of One-Side-Flat Edge on Vortex in Submicro-Scaled Permalloy Disks
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Huang, Chao-Hsien; Yang, Cheng-Ta; Wu, Kuo-Ming; Wu, Tian-Chiuan; Wu, Jong-Ching; Horng, Lance |
| 國立彰化師範大學 |
2010-06 |
Study of One-Side-Flat Edge on Vortex in Submicro-Scaled Permalloy Disks
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Huang, Chao-Hsien; Yang, Cheng-Ta; Wu, Kuo-Ming; Wu, Tian-Chiuan; Wu, Jong-Ching; Horng, Lance |
| 國立成功大學 |
2009-12 |
Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-11 |
Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors
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Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-09 |
An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Shih, J. R.; Wu, Kenneth |
| 國立成功大學 |
2009-04 |
Investigation of Hot-Carrier-Induced Degradation Mechanisms in p-Type High-Voltage Drain Extended Metal-Oxide-Semiconductor Transistors
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Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2009-04 |
Mechanism and Modeling of On-Resistance Degradation in n-Type Lateral Diffused Metal-Oxide-Semiconductor Transistors
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Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
| 國立成功大學 |
2008-12-01 |
Channel length dependence of hot-carrier-induced degradation in n-type drain extended metal-oxide-semiconductor transistors
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Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
Showing items 1-10 of 55 (6 Page(s) Totally)
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