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Institution	Date	Title	Author
國立交通大學	2017-04-21T06:49:37Z	Pad Characterization for CMOS Technology Using Time Domain Reflectometry	Chiu, C. S.; Chen, W. L.; Liao, K. H.; Chen, B. Y.; Teng, Y. M.; Huang, G. W.; Wu, L. K.

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