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Taiwan Academic Institutional Repository >
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"wu san lein"
Showing items 6-15 of 83 (9 Page(s) Totally)
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| 國立成功大學 |
2014-11 |
Low-Frequency Noise Spectra of Laterally Bridged ZnO Microrod-Based Photodetectors
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Chuang, Ming-Yueh; Yu, Hsin-Chieh; Su, Yan-Kuin; Hsiao, Chih-Hung; Kao, Tsung-Hsien; Tsai, Kai-Shiang; Huang, Chien-Sheng; Huang, Yu-Chun; Wu, San-Lein |
| 國立成功大學 |
2014-11 |
Noise Properties of Low-Temperature-Grown Co-Doped ZnO Nanorods as Ultraviolet Photodetectors
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Liu, Chung-Wei; Chang, Shoou-Jinn; Hsiao, Chih-Hung; Lo, Kuang-Yao; Kao, Tsung-Hsien; Wang, Bo-Chin; Young, Sheng-Joue; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2014-10 |
Density-controlled and seedless growth of laterally bridged ZnO nanorod for UV photodetector applications
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Chuang, Ming-Yueh; Yu, Hsin-Chieh; Su, Yan-Kuin; Hsiao, Chih-Hung; Kao, Tsung-Hsien; Huang, Chien-Sheng; Huang, Yu-Chun; Tsai, Jeng-Je; Wu, San-Lein |
| 國立成功大學 |
2014-09 |
Impact of Aluminum Ion Implantation on the Low Frequency Noise Characteristics of Hf-Based High-k/Metal Gate pMOSFETs
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Kao, Tsung-Hsien; Wu, San-Lein; Wu, Chung-Yi; Fang, Yean-Kuen; Wang, Bo-Chin; Huang, Po Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立成功大學 |
2014-08-11 |
Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Wu, Chung-Yi; Wu, San-Lein |
| 國立成功大學 |
2014-08 |
Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses
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Tsar, Shih-Chang; Wu, San-Lein; Huang, Po-Chin; Wang, Bo-Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Cheng, Osbert; Fang, Yean-Kuen; Chang, Shoou-Jinn; Chen, Jone-Fang |
| 國立成功大學 |
2014-07-01 |
Novel Ga-ZnO Nanosheet Structures Applied in Ultraviolet Photodetectors
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Yang, Chih-Chiang; Su, Yan-Kuin; Hsiao, Chih-Hung; Young, Sheng-Joue; Kao, Tsung-Hsien; Chuang, Ming-Yueh; Huang, Yu-Chun; Wang, Bo-Chin; Wu, San-Lein |
| 國立成功大學 |
2014-04 |
Trap properties of high-k/metal gate pMOSFETs with aluminum ion implantation by random telegraph noise and 1/f noise measurements
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Kao, Tsung-Hsien; Wu, San-Lein; Tsai, Kai-Shiang; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立成功大學 |
2014-03 |
ZnO-Based Ultraviolet Photodetectors With Novel Nanosheet Structures
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Young, Sheng-Joue; Liu, Yi-Hsing; Hsiao, Chih-Hung; Chang, Shoou-Jinn; Wang, Bo-Chin; Kao, Tsung-Hsien; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2014 |
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
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Tsai, Shih-Chang; Wu, San-Lein; Chen, Jone-Fang; Wang, Bo-Chin; Huang, Po Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Lo, Kun-Yuan; Cheng, Osbert; Fang, Yean-Kuen |
Showing items 6-15 of 83 (9 Page(s) Totally)
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