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"wu san lein"的相关文件
显示项目 36-60 / 83 (共4页)
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| 國立成功大學 |
2011-06 |
Temperature Dependence of Electrical Characteristics of Strained nMOSFETs Using Stress Memorization Technique
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Huang, Po Chin; Wu, San Lein; Chang, Shoou Jinn; Kuo, Cheng Wen; Chang, Ching Yao; Huang, Yao Tsung; Cheng, Yao Chin; Cheng, Osbert |
| 國立成功大學 |
2011-06 |
Characteristics of Si/SiO(2) Interface Properties for CMOS Fabricated on Hybrid Orientation Substrate Using Amorphization/Templated Recrystallization (ATR) Method
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Huang, Po Chin; Wu, San Lein; Chang, Shoou Jinn; Huang, Yao Tsung; Chen, Jone F.; Lin, Chien Ting; Ma, Mike; Cheng, Osbert |
| 國立成功大學 |
2011-05 |
Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond
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Huang, Yao-Tsung; Wu, San-Lein; Chang, Shoou-Jinn; Hung, Chin-Kai; Wang, Tzu-Juei; Kuo, Cheng-Wen; Huang, Cheng-Tung; Cheng, Osbert |
| 國立成功大學 |
2011-04 |
Investigation of stress memorization process on low-frequency noise performance for strained Si n-type metal-oxide-semiconductor field-effect transistors
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Kuo, Cheng-Wen;Wu, San-Lein;Lin, Hau-Yu;Huang, Yao-Tsung;Chang, Shoou-Jinn;Hong, De-Gong;Wu, Chung-Yi;Cheng, Yao-Chin;Cheng, Osbert |
| 國立成功大學 |
2011-03-21 |
Influences of surface reconstruction on the atomic-layer-deposited HfO(2)/Al(2)O(3)/n-InAs metal-oxide-semiconductor capacitors
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Lin, Hau-Yu; Wu, San-Lein; Cheng, Chao-Ching; Ko, Chih-Hsin; Wann, Clement H.; Lin, You-Ru; Chang, Shoou-Jinn; Wu, Tai-Bor |
| 國立成功大學 |
2011-03-15 |
Effect of annealing time on Si/SiO(2) interface property for CMOS fabricated on hybrid orientation substrate with ATR method
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Huang, Po Chin; Wu, San Lein; Chang, Shoou Jinn; Huang, Yao Tsung; Lin, Chien Ting; Ma, Mike; Cheng, Osbert |
| 國立成功大學 |
2011 |
Influence of surface reconstruction on the atomic-layer-deposited HfO2/Al2O3/n-InAs metal-oxide-semiconductor capacitors
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Lin, Hau-Yu;Wu, San-Lein;Cheng, Chao-Ching;Ko, Chih-Hsin;Wann, Clement H.;Lin, You-Ru;Chang, Shoou-Jinn;Wu, Tai-Bor |
| 國立成功大學 |
2009-08 |
DC and 1/f noise characteristics of strained-Si nMOSFETs using chemical-mechanical-polishing technique
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Lin, Hau Yu; Wu, San Lein; Chang, Shoou Jinn; Kuo, Cheng Wen; Wang, Yen Ping; Hung, Shang Chao |
| 國立成功大學 |
2009-08 |
Investigation of interface characteristics in strained-Si nMOSFETs
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Kuo, Cheng Wen; Wu, San Lein; Chang, Shoou Jinn; Lin, Hau Yu; Wang, Yen Ping; Hung, Shang Chao |
| 國立成功大學 |
2009-07 |
AlGaN/GaN Schottky Barrier UV Photodetectors With a GaN Sandwich Layer
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Lee, K. H.; Chang, Ping-Chuan; Chang, Shoou-Jinn; Wang, Y. C.; Yu, Chia-Lin; Wu, San-Lein |
| 國立成功大學 |
2009-04 |
Impact of Ge Content on Flicker Noise Behavior of Strained-SiGe p-Type Metal-Oxide-Semiconductor Field-Effect Transistors
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Wu, San-Lein; Wu, Chung Yi; Lin, Hau-Yu; Kuo, Cheng-Wen; Chen, Shin-Hsin; Lin, Chung Hsiung; Chang, Shoou-Jinn |
| 國立成功大學 |
2009-04 |
Study of Enhanced Impact Ionization in Strained-SiGe p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors
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Huang, Po-Chin; Kang, Ting-Kuo; Wang, Bo-Chin; Wu, San-Lein; Chang, Shoou-Jinn |
| 國立成功大學 |
2009-01 |
Strained-Si nMOSFET with a raised source/drain structure
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Lin, H. Y.; Wu, San-Lein; Chang, Shoou-Jinn; Wang, Yen-Ping; Lin, Yu-Min; Kuo, Cheng-Wen |
| 國立成功大學 |
2008-11 |
Investigation of Metallized Source/Drain Extension for High-Performance Strained NMOSFETs
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Wang, Tzu-Juei; Ko, Chih-Hsin; Lin, Hong-Nien; Chang, Shoou-Jinn; Wu, San-Lein; Kuan, Ta-Ming; Lee, Wen-Chin |
| 國立成功大學 |
2008-11 |
GaN-Based MSM Photodetectors Prepared on Patterned Sapphire Substrates
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Chang, Shoou-Jinn; Jhou, Y. D.; Lin, Y. C.; Wu, San-Lein; Chen, C. H.; Wen, Ten-Chin; Wu, L. W. |
| 國立成功大學 |
2008-10 |
Low-frequency noise of strained-Si nMOSFETs fabricated on a chemical-mechanical-polished SiGe virtual substrate
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Lin, H. Y.; Wu, San-Lein; Chang, Shoou-Jinn; Wang, Yen-Ping; Kuo, Cheng-Wen |
| 國立成功大學 |
2008-04 |
Investigation of impact ionization in strained-Si n-channel metal-oxide-semiconductor field-effect transistors
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Kang, Ting-Kuo; Huang, Po-Chin; Sa, Yu-Huan; Wu, San-Lein; Chang, Shoou-Jinn |
| 國立成功大學 |
2008-02 |
The effects of mechanical uniaxial stress on junction leakage in nanoscale CMOSFETs
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Wang, Tzu-Juei; Ko, Chih-Hsin; Chang, Shoou-Jinn; Wu, San-Lein; Kuan, Ta-Ming; Lee, Wen-Chin |
| 國立成功大學 |
2007-07-19 |
Negative bias temperature instability characteristics of strained SiGe pMOSFETs
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Lee, C. H.; Wu, San-Lein; Chen, Shin-Hsin; Kuo, Cheng-Wen; Lin, Y. M.; Chen, J. E.; Chang, Shoou-Jinn |
| 國立成功大學 |
2007-05 |
Impact of SiN on performance in novel complementary metal-oxide-semiconductor architecture using substrate strained-SiGe and mechanical strained-Si technology
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Lin, Chung-Hsiung; Wu, San-Lein; Wu, Chung-Yi; Kang, Ting-Kuo; Huang, Kuang-Chih; Chang, Shoou-Jinn |
| 國立成功大學 |
2007-01 |
Tradeoff between short channel effect and mobility in strained-Si nMOSFETs
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Wang, Yen-Ping; Wu, San-Lein; Chang, Shoou-Jinn |
| 國立成功大學 |
2007-01 |
Low-frequency noise characteristics in strained-Si nMOSFETs
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Wang, Yen Ping; Wu, San Lein; Chang, Shoou Jinn |
| 國立成功大學 |
2007 |
Effects of mechanical uniaxial stress on SiGe HBT characteristics
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Wang, Tzu-Juei; Chen, Hung-Wei; Yeh, Ping-Chun; Ko, Chih-Hsin; Chang, Shoou-Jinn; Yeh, John; Wu, San-Lein; Lee, Chwan-Ying; Lee, Wen-Chin; Tang, Denny D. |
| 國立成功大學 |
2007 |
High-detectivity GaN MSM photodetectors with low-temperature GaN cap layers and Ir/Pt contact electrodes
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Yu, Chia-Lin; Chang, Ping-Chuan; Chang, Shoou-Jinn; Wu, San-Lein |
| 國立成功大學 |
2006-05 |
Inductively coupled plasma etching of Si1-xGex in CF4/Ar and Cl-2/Ar discharges
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Wu, San-Lein; Lee, Chun-Hsin; Chang, Shoou-Jinn; Lin, Yu-Min |
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