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"wu san lein"的相關文件
顯示項目 21-30 / 83 (共9頁)
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| 國立成功大學 |
2013-04 |
InGaN/GaN Multiquantum-Well Metal-Semiconductor-Metal Photodetectors With Beta-Ga2O3 Cap Layers
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Huang, Zheng-Da; Weng, Wen-Yin; Chang, Shoou-Jinn; Hua, Yuan-Fu; Chiu, Chiu-Jung; Hsueh, Ting-Jen; Wu, San-Lein |
| 國立成功大學 |
2013-04 |
Effect of Annealing Process on Trap Properties in High-k/Metal Gate n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors through Low-Frequency Noise and Random Telegraph Noise Characterization
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Chiu, Hsu Feng; Wu, San Lein; Chang, Yee Shyi; Chang, Shoou Jinn; Huang, Po Chin; Chen, Jone Fang; Tsai, Shih Chang; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert |
| 國立成功大學 |
2013-04 |
Characterization of Oxide Traps in 28 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise
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Wang, Bo-Chin; Wu, San-Lein; Lu, Yu-Ying; Huang, Chien-Wei; Wu, Chung-Yi; Lin, Yu-Min; Lee, Kun-Hsien; Cheng, Osbert; Huang, Po-Chin; Chang, Shoou-Jinn |
| 國立成功大學 |
2013-03 |
One Step Fabrication of Low Noise CuO Nanowire-Bridge Gas Sensor
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Wang, Sheng-Bo; Hsiao, Chih-Hung; Hung, Shang-Chao; Chang, Shoou-Jinn; Young, Sheng-Joue; Wang, Bo-Chin; Wu, San-Lein; Huang, Bohr-Ran; Han, Hsieh-Cheng |
| 國立成功大學 |
2013-02-01 |
Comparison of the Trap Behavior Between ZrO2 and HfO2 Gate Stack nMOSFETs by 1/f Noise and Random Telegraph Noise
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Wang, Bo Chin; Wu, San Lein; Lu, Yu Ying; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Yang, Chih Wei; Chen, Cheng Guo; Cheng, Osbert; Huang, Po Chin |
| 國立成功大學 |
2012-11 |
GaN Schottky Barrier Photodetectors with a beta-Ga2O3 Cap Layer
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Huang, Zhen-Da; Chuang, Ricky Wenkuei; Weng, Wen-Yin; Chang, Shoou-Jinn; Chiu, Chiu-Jung; Wu, San-Lein |
| 國立成功大學 |
2012-09-17 |
Impact of oxygen annealing on high-k gate stack defects characterized by random telegraph noise
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Chiu, Hsu Feng; Wu, San Lein; Chang, Yee Shyi; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert |
| 國立成功大學 |
2012-09 |
Low-Frequency Noise Characteristics of GaN Schottky Barrier Photodetectors Prepared With Nickel Annealing
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Chen, Tse-Pu; Young, Sheng-Joue; Chang, Shoou-Jinn; Huang, Bohr-Ran; Wang, Shih-Ming; Hsiao, Chih-Hung; Wu, San-Lein; Yang, Chun-Bo |
| 國立成功大學 |
2012-07 |
Correlation Between Random Telegraph Noise and 1/f Noise Parameters in 28-nm pMOSFETs With Tip-Shaped SiGe Source/Drain
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Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立成功大學 |
2012-06-15 |
Comparison studies of InGaN epitaxy with trimethylgallium and triethylgallium for photosensors application
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Lee, Kai-Hsuan; Chang, Ping-Chuan; Chang, Shoou-Jinn; Su, Yan-Kuin; Wu, San-Lein; Pilkuhn, Manfred |
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