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"wu san lein"的相關文件
顯示項目 26-35 / 83 (共9頁)
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| 國立成功大學 |
2012-11 |
GaN Schottky Barrier Photodetectors with a beta-Ga2O3 Cap Layer
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Huang, Zhen-Da; Chuang, Ricky Wenkuei; Weng, Wen-Yin; Chang, Shoou-Jinn; Chiu, Chiu-Jung; Wu, San-Lein |
| 國立成功大學 |
2012-09-17 |
Impact of oxygen annealing on high-k gate stack defects characterized by random telegraph noise
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Chiu, Hsu Feng; Wu, San Lein; Chang, Yee Shyi; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert |
| 國立成功大學 |
2012-09 |
Low-Frequency Noise Characteristics of GaN Schottky Barrier Photodetectors Prepared With Nickel Annealing
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Chen, Tse-Pu; Young, Sheng-Joue; Chang, Shoou-Jinn; Huang, Bohr-Ran; Wang, Shih-Ming; Hsiao, Chih-Hung; Wu, San-Lein; Yang, Chun-Bo |
| 國立成功大學 |
2012-07 |
Correlation Between Random Telegraph Noise and 1/f Noise Parameters in 28-nm pMOSFETs With Tip-Shaped SiGe Source/Drain
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Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立成功大學 |
2012-06-15 |
Comparison studies of InGaN epitaxy with trimethylgallium and triethylgallium for photosensors application
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Lee, Kai-Hsuan; Chang, Ping-Chuan; Chang, Shoou-Jinn; Su, Yan-Kuin; Wu, San-Lein; Pilkuhn, Manfred |
| 國立成功大學 |
2012-03 |
GaN-based Schottky barrier ultraviolet photodetector with a 5-pair AlGaN-GaN intermediate layer
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Lee, Kai Hsuan; Chang, Ping Chuan; Chang, Shoou Jinn; Wu, San Lein |
| 國立成功大學 |
2012-02 |
Characterization of Oxide Tarps in 28 nm p-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Tip-Shaped SiGe Source/Drain Based on Random Telegraph Noise
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Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立臺灣科技大學 |
2012 |
Low-Frequency Noise Characteristics of GaN Schottky Barrier Photodetectors Prepared With Nickel Annealing
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Chen, Tse-Pu;Young, Sheng-Joue;Chang, Shoou-Jinn;Huang, Bohr-Ran;Wang, Shih-Ming;Hsiao, Chih-Hung;Wu, San-Lein;Yang, Chun-Bo |
| 國立成功大學 |
2011-09 |
Origin of Stress Memorization Mechanism in Strained-Si nMOSFETs Using a Low-Cost Stress-Memorization Technique
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Huang, Yao-Tsung; Wu, San-Lein; Chang, Shoou-Jinn; Kuo, Cheng-Wen; Chen, Ya-Ting; Cheng, Yao-Chin; Cheng, Osbert |
| 國立成功大學 |
2011-08 |
InGaN Metal-Semiconductor-Metal Photodetectors With Aluminum Nitride Cap Layers
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Lee, Kai-Hsuan; Chang, Ping-Chuan; Chang, Shoou-Jinn; Wu, San-Lein |
顯示項目 26-35 / 83 (共9頁)
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