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Showing items 1-10 of 83 (9 Page(s) Totally)
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| 國立成功大學 |
2016-01 |
Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Wang, Bo-Chin; Wu, Chung-Yi; Wu, San-Lein |
| 國立成功大學 |
2015-10 |
Temperature dependence of low-frequency noise characteristics in uniaxial tensile strained nMOSFETs
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Huang, Po Chin; Chang, Ching Yao; Cheng, Osbert; Wu, San Lein; Chang, Shoou Jinn |
| 國立成功大學 |
2015-09-10 |
Investigation of Low-Frequency Noise in High-k First/Metal Gate Last HfO2 and ZrO2 nMOSFETs
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Wu, San-Lein; Wang, Bo Chin; Lu, Yu-Ying; Tsai, Shih-Chang; Chen, Jone-Fang; Chang, Shoou-Jinn; Chang, Sheng-Po; Hsu, Che-Hua; Yang, Chih Wei; Chen, Cheng-Guo; Cheng, Osbert; Huang, Po-Chin |
| 國立成功大學 |
2015-05-07 |
Nonvolatile Bio-Memristor Fabricated with Egg Albumen Film
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Chen, Ying-Chih; Yu, Hsin-Chieh; Huang, Chun-Yuan; Chung, Wen-Lin; Wu, San-Lein; Su, Yan-Kuin |
| 國立成功大學 |
2015-03 |
Impact of Uniaxial Strain on Random Telegraph Noise in High-k/Metal Gate pMOSFETs
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Huang, Po-Chin; Chen, Jone F.; Tsai, Shih Chang; Wu, San Lein; Tsai, Kai-Shiang; Kao, Tsung Hsien; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert |
| 國立成功大學 |
2014-11 |
Low-Frequency Noise Spectra of Laterally Bridged ZnO Microrod-Based Photodetectors
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Chuang, Ming-Yueh; Yu, Hsin-Chieh; Su, Yan-Kuin; Hsiao, Chih-Hung; Kao, Tsung-Hsien; Tsai, Kai-Shiang; Huang, Chien-Sheng; Huang, Yu-Chun; Wu, San-Lein |
| 國立成功大學 |
2014-11 |
Noise Properties of Low-Temperature-Grown Co-Doped ZnO Nanorods as Ultraviolet Photodetectors
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Liu, Chung-Wei; Chang, Shoou-Jinn; Hsiao, Chih-Hung; Lo, Kuang-Yao; Kao, Tsung-Hsien; Wang, Bo-Chin; Young, Sheng-Joue; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2014-10 |
Density-controlled and seedless growth of laterally bridged ZnO nanorod for UV photodetector applications
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Chuang, Ming-Yueh; Yu, Hsin-Chieh; Su, Yan-Kuin; Hsiao, Chih-Hung; Kao, Tsung-Hsien; Huang, Chien-Sheng; Huang, Yu-Chun; Tsai, Jeng-Je; Wu, San-Lein |
| 國立成功大學 |
2014-09 |
Impact of Aluminum Ion Implantation on the Low Frequency Noise Characteristics of Hf-Based High-k/Metal Gate pMOSFETs
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Kao, Tsung-Hsien; Wu, San-Lein; Wu, Chung-Yi; Fang, Yean-Kuen; Wang, Bo-Chin; Huang, Po Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立成功大學 |
2014-08-11 |
Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Wu, Chung-Yi; Wu, San-Lein |
Showing items 1-10 of 83 (9 Page(s) Totally)
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