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Showing items 11-35 of 83 (4 Page(s) Totally)
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| 國立成功大學 |
2014-08 |
Investigation of trap properties of Hf0.83Zr0.17O2 high-k gate stack p-type MOSFETs by low-frequency (1/f) noise and random telegraph noise analyses
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Tsar, Shih-Chang; Wu, San-Lein; Huang, Po-Chin; Wang, Bo-Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Cheng, Osbert; Fang, Yean-Kuen; Chang, Shoou-Jinn; Chen, Jone-Fang |
| 國立成功大學 |
2014-07-01 |
Novel Ga-ZnO Nanosheet Structures Applied in Ultraviolet Photodetectors
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Yang, Chih-Chiang; Su, Yan-Kuin; Hsiao, Chih-Hung; Young, Sheng-Joue; Kao, Tsung-Hsien; Chuang, Ming-Yueh; Huang, Yu-Chun; Wang, Bo-Chin; Wu, San-Lein |
| 國立成功大學 |
2014-04 |
Trap properties of high-k/metal gate pMOSFETs with aluminum ion implantation by random telegraph noise and 1/f noise measurements
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Kao, Tsung-Hsien; Wu, San-Lein; Tsai, Kai-Shiang; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立成功大學 |
2014-03 |
ZnO-Based Ultraviolet Photodetectors With Novel Nanosheet Structures
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Young, Sheng-Joue; Liu, Yi-Hsing; Hsiao, Chih-Hung; Chang, Shoou-Jinn; Wang, Bo-Chin; Kao, Tsung-Hsien; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2014 |
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
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Tsai, Shih-Chang; Wu, San-Lein; Chen, Jone-Fang; Wang, Bo-Chin; Huang, Po Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Lo, Kun-Yuan; Cheng, Osbert; Fang, Yean-Kuen |
| 國立成功大學 |
2013-11-01 |
Low-Frequency Noise Characteristics of In-Doped ZnO Ultraviolet Photodetectors
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Chang, Shoou-Jinn; Duan, Bi-Gui; Hsiao, Chih-Hung; Young, Sheng-Joue; Wang, Bo-Chin; Kao, Tsung-Hsien; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2013-11-01 |
Noise Properties of Fe-ZnO Nanorod Ultraviolet Photodetectors
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Chang, Shoou-Jinn; Liu, Chung-Wei; Hsiao, Chih-Hung; Lo, Kuang-Yao; Young, Sheng-Joue; Kao, Tsung-Hsien; Tsai, Kai-Shiang; Wu, San-Lein |
| 國立成功大學 |
2013-09 |
Ga2O3/AlGaN/GaN Heterostructure Ultraviolet Three-Band Photodetector
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Huang, Zheng-Da; Weng, Wen Yin; Chang, Shoou Jinn; Chiu, Chiu-Jung; Hsueh, Ting-Jen; Wu, San-Lein |
| 國立成功大學 |
2013-07 |
Low-Frequency Noise Characteristics for Various ZrO2-Added HfO2-Based 28-nm High-k/Metal-Gate nMOSFETs
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Tsai, Shih Chang; Wu, San Lein; Wang, Bo Chin; Chang, Shoou Jinn; Hsu, Che Hua; Yang, Chih Wei; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert; Huang, Po Chin; Chen, Jone F. |
| 國立成功大學 |
2013-06 |
Low-Frequency Noise Characteristics of ZnO Nanorods Schottky Barrier Photodetectors
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Chen, Tse-Pu; Young, Sheng-Joue; Chang, Shoou-Jinn; Hsiao, Chih-Hung; Ji, Liang-Wen; Hsu, Yu-Jung; Wu, San-Lein |
| 國立成功大學 |
2013-04 |
InGaN/GaN Multiquantum-Well Metal-Semiconductor-Metal Photodetectors With Beta-Ga2O3 Cap Layers
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Huang, Zheng-Da; Weng, Wen-Yin; Chang, Shoou-Jinn; Hua, Yuan-Fu; Chiu, Chiu-Jung; Hsueh, Ting-Jen; Wu, San-Lein |
| 國立成功大學 |
2013-04 |
Effect of Annealing Process on Trap Properties in High-k/Metal Gate n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors through Low-Frequency Noise and Random Telegraph Noise Characterization
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Chiu, Hsu Feng; Wu, San Lein; Chang, Yee Shyi; Chang, Shoou Jinn; Huang, Po Chin; Chen, Jone Fang; Tsai, Shih Chang; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert |
| 國立成功大學 |
2013-04 |
Characterization of Oxide Traps in 28 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise
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Wang, Bo-Chin; Wu, San-Lein; Lu, Yu-Ying; Huang, Chien-Wei; Wu, Chung-Yi; Lin, Yu-Min; Lee, Kun-Hsien; Cheng, Osbert; Huang, Po-Chin; Chang, Shoou-Jinn |
| 國立成功大學 |
2013-03 |
One Step Fabrication of Low Noise CuO Nanowire-Bridge Gas Sensor
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Wang, Sheng-Bo; Hsiao, Chih-Hung; Hung, Shang-Chao; Chang, Shoou-Jinn; Young, Sheng-Joue; Wang, Bo-Chin; Wu, San-Lein; Huang, Bohr-Ran; Han, Hsieh-Cheng |
| 國立成功大學 |
2013-02-01 |
Comparison of the Trap Behavior Between ZrO2 and HfO2 Gate Stack nMOSFETs by 1/f Noise and Random Telegraph Noise
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Wang, Bo Chin; Wu, San Lein; Lu, Yu Ying; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Yang, Chih Wei; Chen, Cheng Guo; Cheng, Osbert; Huang, Po Chin |
| 國立成功大學 |
2012-11 |
GaN Schottky Barrier Photodetectors with a beta-Ga2O3 Cap Layer
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Huang, Zhen-Da; Chuang, Ricky Wenkuei; Weng, Wen-Yin; Chang, Shoou-Jinn; Chiu, Chiu-Jung; Wu, San-Lein |
| 國立成功大學 |
2012-09-17 |
Impact of oxygen annealing on high-k gate stack defects characterized by random telegraph noise
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Chiu, Hsu Feng; Wu, San Lein; Chang, Yee Shyi; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert |
| 國立成功大學 |
2012-09 |
Low-Frequency Noise Characteristics of GaN Schottky Barrier Photodetectors Prepared With Nickel Annealing
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Chen, Tse-Pu; Young, Sheng-Joue; Chang, Shoou-Jinn; Huang, Bohr-Ran; Wang, Shih-Ming; Hsiao, Chih-Hung; Wu, San-Lein; Yang, Chun-Bo |
| 國立成功大學 |
2012-07 |
Correlation Between Random Telegraph Noise and 1/f Noise Parameters in 28-nm pMOSFETs With Tip-Shaped SiGe Source/Drain
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Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立成功大學 |
2012-06-15 |
Comparison studies of InGaN epitaxy with trimethylgallium and triethylgallium for photosensors application
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Lee, Kai-Hsuan; Chang, Ping-Chuan; Chang, Shoou-Jinn; Su, Yan-Kuin; Wu, San-Lein; Pilkuhn, Manfred |
| 國立成功大學 |
2012-03 |
GaN-based Schottky barrier ultraviolet photodetector with a 5-pair AlGaN-GaN intermediate layer
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Lee, Kai Hsuan; Chang, Ping Chuan; Chang, Shoou Jinn; Wu, San Lein |
| 國立成功大學 |
2012-02 |
Characterization of Oxide Tarps in 28 nm p-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Tip-Shaped SiGe Source/Drain Based on Random Telegraph Noise
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Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立臺灣科技大學 |
2012 |
Low-Frequency Noise Characteristics of GaN Schottky Barrier Photodetectors Prepared With Nickel Annealing
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Chen, Tse-Pu;Young, Sheng-Joue;Chang, Shoou-Jinn;Huang, Bohr-Ran;Wang, Shih-Ming;Hsiao, Chih-Hung;Wu, San-Lein;Yang, Chun-Bo |
| 國立成功大學 |
2011-09 |
Origin of Stress Memorization Mechanism in Strained-Si nMOSFETs Using a Low-Cost Stress-Memorization Technique
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Huang, Yao-Tsung; Wu, San-Lein; Chang, Shoou-Jinn; Kuo, Cheng-Wen; Chen, Ya-Ting; Cheng, Yao-Chin; Cheng, Osbert |
| 國立成功大學 |
2011-08 |
InGaN Metal-Semiconductor-Metal Photodetectors With Aluminum Nitride Cap Layers
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Lee, Kai-Hsuan; Chang, Ping-Chuan; Chang, Shoou-Jinn; Wu, San-Lein |
Showing items 11-35 of 83 (4 Page(s) Totally)
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