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| 國立交通大學 |
2014-12-08T15:14:32Z |
Systematical study of reliability issues in plasma-nitrided and thermally nitrided oxides for advanced dual-gate oxide p-channel metal-oxide-semiconductor field-effect transistors
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Lo, Wen-Cheng; Wu, Shien-Yang; Chang, Sun-Jay; Chiang, Mu-Chi; Lin, Chih-Yung; Chao, Tien-Sheng; Chang, Chun-Yen |
| 國立成功大學 |
2007-04 |
Impact of mobility degradation and supply voltage on negative-bias temperature instability in advanced p-channel metal-oxide-semiconductor field-effect transistors
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Chen, Jone-Fang; Yang, Dao-Hong; Lin, Chih-Yung; Wu, Shien-Yang |
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