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Showing items 1-16 of 16 (1 Page(s) Totally)
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| 國立交通大學 |
2020-10-05T02:02:03Z |
Gamma-Ray Irradiation Effect on Ferroelectric Devices with Hafnium Aluminum Oxides
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Tung, Yi-Chun; Wu, Tian-Li; Cheng, Chun-Hu; Tseng, Chih-Yang; Chen, Hsuan-Han; Chen, Hsi-Han; Ma, Jun; Lin, Chien-Liang; Zheng, Zhi-Wei; Chou, Wu-Ching; Hsu, Hsiao-Hsuan; Liu, Chien |
| 國立交通大學 |
2020-10-05T02:02:00Z |
Design and analysis of high electron mobility transistor inspired: III-V electro-optic modulator topologies
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Das, Pallabi; Wu, Tian-Li; Tallur, Siddharth |
| 國立交通大學 |
2020-10-05T01:59:47Z |
Effects of gamma-Ray Irradiation on AlGaN/GaN Heterostructures and High Electron Mobility Transistor Devices
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Sharma, Chandan; Singh, Rajendra; Chao, Der-Sheng; Wu, Tian-Li |
| 國立交通大學 |
2020-05-05T00:02:26Z |
Improved TDDB Reliability and Interface States in 5-nm Hf0.5Zr0.5O2 Ferroelectric Technologies Using NH3 Plasma and Microwave Annealing
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Wu, Tian-Li; Hu, Chenming; Yang, Ting-Hsin; Chen, Yi-Hsuan; Su, Chun-Jung |
| 國立交通大學 |
2020-04-01 |
Impact of the polarization on time-dependent dielectric breakdown in ferroelectric Hf0.5Zr0.5O2 on Ge substrates
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Wu, Tian-Li; Wang, Yu-Shun; Kao, Kuo-Hsing; Lee, Yao-Jen; Su, Chun-Jung; Yang, Ting-Hsin |
| 國立交通大學 |
2020-04-01 |
Study on the effects of Si implantation on the interface of 4H-SiC lateral MOSFETs
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Wu, Tian-Li; Huang, Chi-Fang; Huang, Pin-Wei; Hung, Jia-Qing; Jiang, Jheng-Yi |
| 國立交通大學 |
2020-03-01 |
Numerical Study of 4H-SiC UMOSFETs with Split-Gate and P plus Shielding
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Wu, Tian-Li; Zhao, Feng; Huang, Chih-Fang; Jiang, Jheng-Yi |
| 國立交通大學 |
2020-03-01 |
Understanding gamma-Ray Induced Instability in AlGaN/GaN HEMTs Using a Physics-Based Compact Model
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Vinayak, Seema; Singh, Rajendra; Visvkarma, Ajay Kumar; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo; Wu, Tian-Li; Sharma, Chandan; Modolo, Nicola |
| 國立交通大學 |
2020-02-02T23:54:40Z |
Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative gamma-ray irradiation
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Sharma, Chandan; Modolo, Nicola; Chen, Hsi-Han; Tseng, Yang-Yan; Tang, Shun-Wei; Meneghini, Matteo; Meneghesso, Gaudenzio; Zanoni, Enrico; Singh, Rajendra; Wu, Tian-Li |
| 國立交通大學 |
2020-02-01 |
Investigation of Recessed Gate AlGaN/GaN MIS-HEMTs with Double AlGaN Barrier Designs toward an Enhancement-Mode Characteristic
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Jiang, Hong-Jia; Wu, Tian-Li; Tang, Shun-Wei |
| 國立交通大學 |
2019-12-13T01:12:50Z |
Demonstration of Annealing-free Metal-Insulator-Semiconductor (MIS) Ohmic Contacts on a GaN Substrate using Low Work-function Metal Ytterbium (Yb) and Al2O3 Interfacial Layer
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Wu, Tian-Li; Tseng, Yang-Yan; Huang, Chih-Fang; Chen, Zih-Sin; Lin, Chih-Chien; Chung, Chung-Jen; Huang, Po-Kai; Kao, Kuo-Hsing |
| 國立交通大學 |
2019-08-02T02:24:17Z |
Investigation of Degradation Phenomena in GaN-on-Si Power MIS-HEMTs under Source Current and Drain Bias Stresses
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Yang, Chih-Yi; Wu, Tian-Li; Hsieh, Tin-En; Chang, Edward Yi |
| 國立交通大學 |
2019-04-02T05:58:23Z |
Effects of Annealing on Ferroelectric Hafnium-Zirconium-Oxide-Based Transistor Technology
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Chen, Yi-Hsuan; Su, Chun-Jung; Hu, Chenming; Wu, Tian-Li |
| 國立交通大學 |
2018-08-21T05:57:09Z |
Bias- and Temperature-Assisted Trapping/De-trapping of R-ON Degradation in D-mode AlGaN/GaN MIS-HEMTs on a Si substrate
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Zhang, Jin-Ming; Hsieh, Ting-En; Wu, Tian-Li; Chen, Szu-Hao; Chen, Shi-Xuan; Chou, Po-Chien; Chang, Edward Yi |
| 國立交通大學 |
2018-08-21T05:53:02Z |
Analysis of the Gate Capacitance-Voltage Characteristics in p-GaN/AlGaN/GaN Heterostructures
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Wu, Tian-Li; Bakeroot, Benoit; Liang, Hu; Posthuma, Niels; You, Shuzhen; Ronchi, Nicolo; Stoffels, Steve; Marcon, Denis; Decoutere, Stefaan |
| 國立交通大學 |
2014-12-08T15:23:24Z |
Characteristics of 4H-SiC RF MOSFETs on a Semi-insulating Substrate
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Wu, Tian-Li; Huang, Chih-Fang; Cheng, Chun-Hu |
Showing items 1-16 of 16 (1 Page(s) Totally)
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