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國立交通大學 |
2018-08-21T05:54:06Z |
Recovery of failed resistive switching random access memory devices by a low-temperature supercritical treatment
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Du, Xiaoqin; Wu, Xiaojing; Chang, Ting-Chang; Chang, Kuan-Chang; Pan, Chih-Hung; Wu, Cheng-Hsien; Lin, Yu-Shuo; Chen, Po-Hsun; Zhang, Shengdong; Sze, Simon M. |
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