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"wu y l"的相關文件
顯示項目 346-372 / 372 (共8頁) << < 1 2 3 4 5 6 7 8 > >> 每頁顯示[10|25|50]項目
| 臺北醫學大學 |
1998 |
The Influence of Transient and Strong Load on Periodontium.
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李勝揚; Wu C-H; Su C-Y; Wu Y-L; Chang W-J; Hsu K-D; Lee S-Y |
| 國立臺灣大學 |
1995 |
Improvement in Reliability of n-MOSFETs by Using Rapid Thermal N20- Reoxidized Gate Oxides
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胡振國; Wu, Y. L.; Wu, Z. Y.; Hwu, Jenn-Gwo; Wu, Y. L.; Wu, Z. Y. |
| 臺大學術典藏 |
1995 |
Intrathoracic goiter with superior vena cava syndrome and tracheal compression. A case report
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Lee Y.-C.; Luh S.-P.; Wu Y.-L.; JANG-MING LEE; Tai H.-C.; Tai H.-C.;Wu Y.-L.;Jang-Ming Lee;Luh S.-P.;Lee Y.-C. |
| 國立臺灣大學 |
1994 |
Subaortic Blind Mitral Pouch in a Double-Inlet Right Ventricle
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邱英世; Wu, Y. L.; Chen, M. R.; Chen, B. F.; Chiu, Ing-Sh; Wu, Y. L.; Chen, M. R.; Chen, B. F. |
| 國立臺灣大學 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
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胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 國立臺灣大學 |
1994 |
Characterization of Metal-Oxide-Semiconductor Capacitors with Improved Gate Oxides Prepared by Repeated Rapid Thermal Annealings in N20
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胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1994 |
Design of Radiation Hard CMOS Circuits by Changing Aspect Ratios and Adding Compensation Resistors
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胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1994 |
Effect of Starting Oxide Preparation on Electrical Properties of Reoxidized Nitrided and N20-Annealed Gate Oxides
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胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1994 |
Improvement in Radiation Hardness of Gate Oxides in Metal-Oxide- Semiconductor Devices by Repeated Rapid Thermal Oxidations in N20
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胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1994 |
Reduction of Radiation-Induced Degradation in N-Channel Metal-Oxide- Semiconductor Field-Effect Transistors (MOSFET's) with Gate Oxides Prepared by Repeated Rapid Thermal N20 Annealing
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胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 國立臺灣大學 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
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胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 國立臺灣大學 |
1994 |
Serological Responses of Patients with Nasopharyngeal Carcinoma to an N-Terminal Epstein-Barr Virus DNA Polymerase Expressed in Procaryotic Cells
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Liu, M. Y.; Wu, Y. L.; Chen, L. S.; 陳振陽; Yang, C. S.; Liu, M. Y.; Wu, Y. L.; Chen, L. S.; Chen, Jan-Yang; Yang, C. S. |
| 臺大學術典藏 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
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Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 臺大學術典藏 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
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Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Kuo, K. M. |
| 國立臺灣大學 |
1993 |
Right Pulmonary Artery Arising from Ascending Aorta:Report of a Successfully Treated Case
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邱英世; Siy, L. L; Chen, M. R.; Lee, B. S.; Chiu, C. B.; Wu, Y. L.; Chiu, Ing-Sh; Siy, L. L; Chen, M. R.; Lee, B. S.; Chiu, C. B.; Wu, Y. L. |
| 國立臺灣大學 |
1993 |
Improved Gate Oxide Reliability by Repeated N20 Rapid Thermal Annealings
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胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1993 |
Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer
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胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; Wu, Y. L. |
| 國立臺灣大學 |
1993 |
Improvement in Radiation Hardness of Reoxidized Nitrided Oxide (RNO) in the Absence of Post-Oxidation Anneal
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胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1993 |
Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer
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胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; Wu, Y. L. |
| 臺大學術典藏 |
1993 |
Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer
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Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; 胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y. |
| 臺大學術典藏 |
1993 |
Improved Gate Oxide Reliability by Repeated N20 Rapid Thermal Annealings
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Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L.; 胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 臺大學術典藏 |
1993 |
Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer
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Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; 胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1992 |
Effect of Fast Pulling the Starting Oxide Out of Furnace on the Radiation Hardness of MOS Capacitors with Reoxidixed-Nitrided Oxides
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胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1992 |
Improvement in Surface Cleaning of Oxides by Rapid Thermal Annealing
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胡振國; Lin, J. J.; Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J.; Wu, Y. L. |
| 臺大學術典藏 |
1992 |
Effect of Fast Pulling the Starting Oxide Out of Furnace on the Radiation Hardness of MOS Capacitors with Reoxidixed-Nitrided Oxides
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Wu, Y. L.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Hwu, Jenn-Gwo |
| 臺大學術典藏 |
1992 |
Improvement in Surface Cleaning of Oxides by Rapid Thermal Annealing
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Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J.; 胡振國; Lin, J. J.; Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J. |
| 國立臺灣大學 |
1963 |
Spectrophotometric Study of the Complexes of Ge, Zr and Hf with Gallein
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Pan, K.; 林聖賢; Wu, Y. L.; Chen, Y. M.; Pan, K.; Lin, Sheng-Hsien; Wu, Y. L.; Chen, Y. M. |
顯示項目 346-372 / 372 (共8頁) << < 1 2 3 4 5 6 7 8 > >> 每頁顯示[10|25|50]項目
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