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Showing items 356-372 of 372 (15 Page(s) Totally)
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| 國立臺灣大學 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
|
胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 國立臺灣大學 |
1994 |
Serological Responses of Patients with Nasopharyngeal Carcinoma to an N-Terminal Epstein-Barr Virus DNA Polymerase Expressed in Procaryotic Cells
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Liu, M. Y.; Wu, Y. L.; Chen, L. S.; 陳振陽; Yang, C. S.; Liu, M. Y.; Wu, Y. L.; Chen, L. S.; Chen, Jan-Yang; Yang, C. S. |
| 臺大學術典藏 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
|
Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M. |
| 臺大學術典藏 |
1994 |
Improvement in Radiation Hardness of n-MOSFET's with Gate Oxides Prepared by Multiple N20 Annealings
|
Hwu, Jenn-Gwo; Wu, Y. L.; Kuo, K. M.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Kuo, K. M. |
| 國立臺灣大學 |
1993 |
Right Pulmonary Artery Arising from Ascending Aorta:Report of a Successfully Treated Case
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邱英世; Siy, L. L; Chen, M. R.; Lee, B. S.; Chiu, C. B.; Wu, Y. L.; Chiu, Ing-Sh; Siy, L. L; Chen, M. R.; Lee, B. S.; Chiu, C. B.; Wu, Y. L. |
| 國立臺灣大學 |
1993 |
Improved Gate Oxide Reliability by Repeated N20 Rapid Thermal Annealings
|
胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1993 |
Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer
|
胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; Wu, Y. L. |
| 國立臺灣大學 |
1993 |
Improvement in Radiation Hardness of Reoxidized Nitrided Oxide (RNO) in the Absence of Post-Oxidation Anneal
|
胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1993 |
Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer
|
胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; Wu, Y. L. |
| 臺大學術典藏 |
1993 |
Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer
|
Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y.; 胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Z. Y. |
| 臺大學術典藏 |
1993 |
Improved Gate Oxide Reliability by Repeated N20 Rapid Thermal Annealings
|
Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L.; 胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 臺大學術典藏 |
1993 |
Improved Performance of n-MOSFET's with Reoxidized Nitrided Oxide (RNO) by Using N20 as the Reoxidizer
|
Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; 胡振國; Wu, Z. Y.; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1992 |
Effect of Fast Pulling the Starting Oxide Out of Furnace on the Radiation Hardness of MOS Capacitors with Reoxidixed-Nitrided Oxides
|
胡振國; Wu, Y. L.; Hwu, Jenn-Gwo; Wu, Y. L. |
| 國立臺灣大學 |
1992 |
Improvement in Surface Cleaning of Oxides by Rapid Thermal Annealing
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胡振國; Lin, J. J.; Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J.; Wu, Y. L. |
| 臺大學術典藏 |
1992 |
Effect of Fast Pulling the Starting Oxide Out of Furnace on the Radiation Hardness of MOS Capacitors with Reoxidixed-Nitrided Oxides
|
Wu, Y. L.; Hwu, Jenn-Gwo; 胡振國; Wu, Y. L.; Hwu, Jenn-Gwo |
| 臺大學術典藏 |
1992 |
Improvement in Surface Cleaning of Oxides by Rapid Thermal Annealing
|
Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J.; 胡振國; Lin, J. J.; Wu, Y. L.; Hwu, Jenn-Gwo; Lin, J. J. |
| 國立臺灣大學 |
1963 |
Spectrophotometric Study of the Complexes of Ge, Zr and Hf with Gallein
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Pan, K.; 林聖賢; Wu, Y. L.; Chen, Y. M.; Pan, K.; Lin, Sheng-Hsien; Wu, Y. L.; Chen, Y. M. |
Showing items 356-372 of 372 (15 Page(s) Totally)
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