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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T06:04:44Z |
Study of low-temperature and post-stress hysteresis in high-k gate dielectrics
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Wu, You-Lin; Lin, Shi-Tin; Yang, Chang Cheng; Wu, Chien-Hung; Chin, Albert |
| 亞洲大學 |
2019 |
醫師說明義務之研究
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吳侑臨; Wu, You-Lin |
| 國立交通大學 |
2017-04-21T06:49:51Z |
Comparison of Multiple-Polysilicon-Nanowire pH-Sensors Coated with Different ALD-Deposited High-k Dielectric Materials
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Hsu, Po-Yen; Wu, Chun-Yu; Cheng, Huang-Chung; Wu, You-Lin; Chang, Wei-Tzu; Shen, Yuan-Lin; Chang, Che-Ming; Wang, Chia-Chung; Lin, Jing-Jenn |
| 國立交通大學 |
2017-04-21T06:49:09Z |
Study of low-temperature and post-stress hysteresis in high-k gate dielectrics
|
Wu, You-Lin; Lin, Shi-Tin; Yang, Chang Cheng; Wu, Chien-Hung; Chin, Albert |
| 國立交通大學 |
2014-12-08T15:32:46Z |
Polysilicon Nanowire Sensor Devices Based on High-k Dielectric Membrane for pH Sensing and DNA Detection
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Wu, Chun-Yu; Hsu, Po-Yen; Wang, Chao-Lung; Liao, Ta-Chuan; Cheng, Huang-Chung; Wu, You-Lin |
| 國立交通大學 |
2014-12-08T15:24:17Z |
High Sensitivity of Dry-Type Nanowire Sensors With High-k Dielectrics for pH Detection via Capillary Atomic Force Microscope Tip Coating Technique
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Cheng, Huang-Chung; Wu, Chun-Yu; Hsu, Po-Yen; Wang, Chao-Lung; Liao, Ta-Chuan; Wu, You-Lin |
| 國立臺灣大學 |
1995 |
Improvement in reliability of n-MOSFETs by using rapid thermal N2O-reoxidized nitrided gate oxides
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Wu, You-Lin; Wu, Zhao-Yin; Hwu, Jenn-Gwo |
Showing items 1-7 of 7 (1 Page(s) Totally)
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