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Taiwan Academic Institutional Repository >
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"wu yu sheng"
Showing items 6-30 of 38 (2 Page(s) Totally)
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| 國立交通大學 |
2014-12-12T02:36:34Z |
介電質式氮化鎵垂直共振腔面射型雷射之研究
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吳宇勝; Wu, Yu-Sheng; 盧廷昌; Lu, Tien-Chang |
| 國立交通大學 |
2014-12-12T01:24:36Z |
先進CMOS元件結構的解析模型建立－量子侷限效應及製程變異敏感度之探討
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吳育昇; Wu, Yu-Sheng; 蘇彬; Su, Pin |
| 國立交通大學 |
2014-12-08T15:38:25Z |
Impact of Surface Orientation on the Sensitivity of FinFETs to Process Variations-An Assessment Based on the Analytical Solution of the Schrodinger Equation
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:38:05Z |
Impact of Quantum Confinement on Short-Channel Effects for Ultrathin-Body Germanium-on-Insulator MOSFETs
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Wu, Yu-Sheng; Hsieh, Hsin-Yuan; Hu, Vita Pi-Ho; Su, Pin |
| 國立交通大學 |
2014-12-08T15:36:36Z |
Fabrication and characteristics of a GaN-based microcavity laser with shallow etched mesa
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Lai, Ying-Yu; Chou, Yu-Hsun; Wu, Yu-Sheng; Lan, Yu-Pin; Lu, Tien-Chang; Wang, Shing-Chung |
| 國立交通大學 |
2014-12-08T15:25:22Z |
Quantum Confinement Effect in Short-Channel Gate-All-Around MOSFETs and Its Impact on the Sensitivity of Threshold Voltage to Process Variations
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:25:21Z |
Investigation of Static Noise Margin of FinFET SRAM Cells in Sub-threshold Region
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Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:24:25Z |
Investigation of Static Noise Margin of Ultra-Thin-Body SOI SRAM Cells in Subthreshold Region using Analytical Solution of Poisson's Equation
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Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:23:32Z |
Impact of Quantum Confinement on Backgate-Bias Modulated Threshold-Voltage and Subthreshold Characteristics for Ultra-Thin-Body GeOI MOSFETs
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Yu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin |
| 國立交通大學 |
2014-12-08T15:22:22Z |
Impact of Quantum Confinement on Subthreshold Swing and Electrostatic Integrity of Ultra-Thin-Body GeOI and InGaAs-OI n-MOSFETs
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Yu, Chang-Hung; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin |
| 國立交通大學 |
2014-12-08T15:21:54Z |
A Closed-Form Quantum "Dark Space" Model for Predicting the Electrostatic Integrity of Germanium MOSFETs With High-k Gate Dielectric
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:19:54Z |
Design and Analysis of Ultra-Thin-Body SOI Based Subthreshold SRAM
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Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:16:47Z |
Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D Poisson's equation
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:12:24Z |
Investigation of random dopant fluctuation for multi-gate metal-oxide-semiconductor field-effect transistors using analytical solutions of three-dimensional Poisson's equation
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:12:12Z |
Sensitivity of multigate MOSFETs to process variations - An assessment based on analytical solutions of 3-D Poisson's equation
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Comparison of 4T and 6T FinFET SRAM Cells for Subthreshold Operation Considering Variability-A Model-Based Approach
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Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Hsieh, Chien-Yu; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:11:57Z |
Investigation of Electrostatic Integrity for Ultrathin-Body Germanium-On-Nothing MOSFET
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Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:10:41Z |
Sensitivity of Gate-All-Around Nanowire MOSFETs to Process Variations-A Comparison With Multigate MOSFETs
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:09:42Z |
Investigation of electrostatic integrity for ultra-thin-body GeOI MOSFET using analytical solution of Poisson's equation
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Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:08:46Z |
Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells-An Assessment Based on Analytical Solutions of Poisson's Equation
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Hu, Vita Pi-Ho; Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:08:20Z |
Analytical Quantum-Confinement Model for Short-Channel Gate-All-Around MOSFETs Under Subthreshold Region
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Wu, Yu-Sheng; Su, Pin |
| 國立交通大學 |
2014-12-08T15:07:33Z |
Investigation of Switching-Time Variations for Nanoscale MOSFETs Using the Effective-Drive-Current Approach
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Wu, Yu-Sheng; Fan, Ming-Long; Su, Pin |
| 國立交通大學 |
2014-12-08T15:06:44Z |
Investigation of Cell Stability and Write Ability of FinFET Subthreshold SRAM Using Analytical SNM Model
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Fan, Ming-Long; Wu, Yu-Sheng; Hu, Vita Pi-Ho; Su, Pin; Chuang, Ching-Te |
| 國立交通大學 |
2014-12-08T15:01:50Z |
Investigation of Electrostatic Integrity for Ultra-Thin-Body GeOI MOSFET Using Analytical Solution of Poisson's Equation
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Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin |
| 國立成功大學 |
2014-09 |
Al2O3-Passivated AlGaN/GaN HEMTs by Using Nonvacuum Ultrasonic Spray Pyrolysis Deposition Technique
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Chou, Bo-Yi; Liu, Han-Yin; Hsu, Wei-Chou; Lee, Ching-Sung; Wu, Yu-Sheng; Sun, Wen-Ching; Wei, Sung-Yen; Yu, Sheng-Min |
Showing items 6-30 of 38 (2 Page(s) Totally)
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