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Showing items 1-15 of 15 (1 Page(s) Totally)
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| 國立成功大學 |
2005-09 |
A high-efficiency CMOS image sensor with air gap in situ MicroLens (AGML) fabricated by 0.18-/-mu m CMOS technology
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Yao, L. L.; Wang, Wen-De; Wang, Chung-Shu; Chen, Shih-Fang |
| 國立成功大學 |
2005-08 |
An effective method to improve the sensitivity of deep submicrometer CMOS image sensors
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Lin, J. S.; Wuu, Shou-Gwo; Chien, H. C.; Tseng, Chien-Hsien; Wang, Chung-Shu; Chen, Shih-Fang; Lin, Chun-Yue; Lin, Chun-Sheng; Chou, Tse-Heng |
| 國立成功大學 |
2005-05 |
Color mixing improvement of CMOS image sensor with air-gap-guard ring in deep-submicrometer CMOS technology
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue |
| 國立成功大學 |
2004-06 |
Dramatic reduction of optical crosstalk in deep-submicrometer CMOS imager with air gap guard ring
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, Chung-Shu; Lin, J. S.; Tseng, Chien-Hsien; Chen, Shih-Fang; Lin, Chun-Sheng; Lin, Chun-Yue |
| 國立成功大學 |
2004-06 |
The mechanism and evaluation of hot-carrier-induced performance degradation in 0.18-/mu m CMOS image sensor
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Wang, C. S.; Lin, J. S.; Tseng, C. H.; Chen, S. F.; Lin, C. S.; Lin, C. Y. |
| 國立成功大學 |
2004-01 |
Light guide for pixel crosstalk improvement in deep submicron CMOS image sensor
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Hsu, Tzu-Hsuan; Fang, Yean-Kuen; Lin, C. Y.; Chen, S. F.; Lin, C. S.; Yaung, Dun-Nian; Wuu, Shou-Gwo; Chien, H. C.; Tseng, C. H.; Lin, J. S.; Wang, C. S. |
| 國立成功大學 |
2002-03 |
On the high-performance Ti-salicide ULSI CMOS devices prepared by a borderless contact technique and double-implant structure
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Thei, Kong-Beng; Chuang, Hung-Ming; Yu, Kuo-Hui; Liu, Wen-Chau; Liu, Rong-Chau; Lin, Kun-Wei; Su, Chi-Wen; Ho, Chin-Shiung; Wuu, Shou-Gwo; Wang, Chung-Shu |
| 國立成功大學 |
2001-08 |
A novel double ion-implant (DII) Ti-salicide technology for high-performance sub-0.25-mu m CMOS devices applications
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Thei, Kong-Beng; Liu, Wen-Chau; Chuang, Hung-Ming; Lin, Kun-Wei; Cheng, Chin-Chuan; Ho, Chin-Hsiung; Su, Chi-Wen; Wuu, Shou-Gwo; Wang, Chung-Shu |
| 國立成功大學 |
2001-02-01 |
Subthreshold characteristics of submicrometer polysilicon thin film transistor
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Yaung, Dun-Nian; Fang, Yean-Kuen; Huang, Kuo-Ching; Wang, Y. J.; Hung, C. C.; Liang, Mong-Song; Wuu, Shou-Gwo |
| 國立成功大學 |
2001-02 |
Nonsilicide source/drain pixel for 0.25-mu m CMOS image sensor
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Yaung, Dun-Nian; Wuu, Shou-Gwo; Fang, Yean-Kuen; Wang, Chung-Shu; Tseng, Chien-Hsien; Liang, Mon-Song |
| 國立成功大學 |
2001-01 |
To suppress photoexcited current of hydrogenated polysilicon TFTs with low temperature oxidation of polychannel
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Yaung, Dun-Nian; Fang, Yean-Kuen; Chen, Chung-Hui; Hung, C. C.; Tsao, F. C.; Wuu, Shou-Gwo; Liang, Mong-Song |
| 國立成功大學 |
2000-11-01 |
High performance submicron bottom gate TFTs with self aligned Ti-silicide interpoly contact and poly-channel oxidation for high-density SRAM
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Yaung, Dun-Nian; Fang, Yean-Kuen; Huang, Kuo-Ching; Chen, Chin-Ying; Wang, Y. J.; Hung, C. C.; Wuu, Shou-Gwo; Liang, Mong-Song |
| 國立成功大學 |
2000-09 |
Mechanism of device instability for unhydrogenated polysilicon TFTs under off-state stress
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Yaung, Dun-Nian; Fang, Yean-Kuen; Huang, Kuo-Ching; Chen, Chin-Ying; Wang, Y. J.; Hung, C. C.; Wuu, Shou-Gwo; Liang, Mong-Song |
| 國立成功大學 |
2000-07 |
A new and improved borderless contact (BLC) structure for high-performance Ti-salicide in sub-quarter micron CMOS devices
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Liu, Wen-Chau; Thei, Kong-Beng; Wang, Wei-Chou; Pan, Hsi-Jen; Wuu, Shou-Gwo; Lei, Ming-Ta; Wang, Chung-Shu; Cheng, Shiou-Ying |
| 國立成功大學 |
1999-11-25 |
Thin nitride-capped poly-resistor for high density and high performance SRAM with self-aligned-contact
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Yaung, Dun-Nian; Fang, Yean-Kuen; Huang, Kuo-Ching; Wuu, Shou-Gwo; Wang, Chung-Shu; Liang, Mong-Song |
Showing items 1-15 of 15 (1 Page(s) Totally)
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