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機構	日期	題名	作者
臺大學術典藏	2018-09-10T15:00:40Z	FPGA-Based Subset Sum Delay Lines	C.-Y. Wang;Y.-Y. Chen;J.-L. Huang;X.-L. Huang; C.-Y. Wang; Y.-Y. Chen; J.-L. Huang; X.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T15:00:40Z	FPGA-Based Subset Sum Delay Lines	C.-Y. Wang;Y.-Y. Chen;J.-L. Huang;X.-L. Huang; C.-Y. Wang; Y.-Y. Chen; J.-L. Huang; X.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:50:52Z	A mutual characterization based SAR ADC self-testing technique	H.-J. Lin;X.-L. Huang;J.-L. Huang; H.-J. Lin; X.-L. Huang; J.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:50:52Z	A mutual characterization based SAR ADC self-testing technique	H.-J. Lin;X.-L. Huang;J.-L. Huang; H.-J. Lin; X.-L. Huang; J.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:50:52Z	An IDDQ-Based Source Driver IC Design-for-Test Technique	S.-S. Lin;C.-L. Kao;J.-L. Huang;C.-C. Lee;X.-L. Huang; S.-S. Lin; C.-L. Kao; J.-L. Huang; C.-C. Lee; X.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:50:52Z	An IDDQ-Based Source Driver IC Design-for-Test Technique	S.-S. Lin;C.-L. Kao;J.-L. Huang;C.-C. Lee;X.-L. Huang; S.-S. Lin; C.-L. Kao; J.-L. Huang; C.-C. Lee; X.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration	X.-L. Huang;J.-L. Huang;H.-I. Chen;C.-Y. Chen;K.-T. Tseng;M.-F. Huang;Y.-F. Chou;D.-M. Kwai; X.-L. Huang; J.-L. Huang; H.-I. Chen; C.-Y. Chen; K.-T. Tseng; M.-F. Huang; Y.-F. Chou; D.-M. Kwai; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration	X.-L. Huang;J.-L. Huang;H.-I. Chen;C.-Y. Chen;K.-T. Tseng;M.-F. Huang;Y.-F. Chou;D.-M. Kwai; X.-L. Huang; J.-L. Huang; H.-I. Chen; C.-Y. Chen; K.-T. Tseng; M.-F. Huang; Y.-F. Chou; D.-M. Kwai; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	A SAR ADC missing-decision level detection and removal technique	X.-L. Huang;J.-L. Huang;Y.-F. Chou;D.-M. Kwai; X.-L. Huang; J.-L. Huang; Y.-F. Chou; D.-M. Kwai; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	A SAR ADC missing-decision level detection and removal technique	X.-L. Huang;J.-L. Huang;Y.-F. Chou;D.-M. Kwai; X.-L. Huang; J.-L. Huang; Y.-F. Chou; D.-M. Kwai; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	Pre-bond characterization of 1-bit/stage pipelined ADC for 3D-IC applications	Y.-H. Chou;J.-L. Huang;X.-L. Huang; Y.-H. Chou; J.-L. Huang; X.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	Pre-bond characterization of 1-bit/stage pipelined ADC for 3D-IC applications	Y.-H. Chou;J.-L. Huang;X.-L. Huang; Y.-H. Chou; J.-L. Huang; X.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T08:47:21Z	ADC/DAC Loopback Linearity Testing by DAC Output Offsetting and Scaling	X.-L. Huang; J.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T08:47:21Z	A self-testing and calibration method for embedded successive approximation register ADC	X.-L. Huang; P.-Y. Kang; H.-M. Chang; J.-L. Huang; Y.-F. Chou; Y.-P. Lee; D.-M. Kwai; C.-W. Wu; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T08:47:21Z	A pre- and post-bond self-testing and calibration methodology for SAR ADC Array in 3-D Imager	X.-L. Huang; P.-Y. Kang; J.-L. Huang; Y.-F. Chou; Y.-P. Lee; D.-M. Kwai; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:04Z	Co-Calibration of Capacitor Mismatch and Comparator Offset for 1-Bit/Stage Pipelined ADC	X.-L. Huang;Yuan-Chi Yu;Jiun-Lang Huang; X.-L. Huang; Yuan-Chi Yu; Jiun-Lang Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:04Z	Co-Calibration of Capacitor Mismatch and Comparator Offset for 1-Bit/Stage Pipelined ADC	X.-L. Huang;Yuan-Chi Yu;Jiun-Lang Huang; X.-L. Huang; Yuan-Chi Yu; Jiun-Lang Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:04Z	A Self-Testing Assisted Pipelined-ADC Calibration Technique	J.-L. Huang;X.-L. Huang;P.-Y. Kang; J.-L. Huang; X.-L. Huang; P.-Y. Kang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:04Z	A Self-Testing Assisted Pipelined-ADC Calibration Technique	J.-L. Huang;X.-L. Huang;P.-Y. Kang; J.-L. Huang; X.-L. Huang; P.-Y. Kang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:04Z	An On-Chip Integrator Leakage Characterization Technique and Its Applications to Switched Capacitor Circuits Testing	C.-Y. Yang;X.-L. Huang;J.-L. Huang; C.-Y. Yang; X.-L. Huang; J.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:04Z	An On-Chip Integrator Leakage Characterization Technique and Its Applications to Switched Capacitor Circuits Testing	C.-Y. Yang;X.-L. Huang;J.-L. Huang; C.-Y. Yang; X.-L. Huang; J.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:03Z	A DfT Technique for Diagnosing Integrator Leakage of Single-Bit First-Order Delta-Sigma Modulator Using DC Input	X.-L. Huang;C.-Y. Yang;J.-L. Huang; X.-L. Huang; C.-Y. Yang; J.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:03Z	A DfT Technique for Diagnosing Integrator Leakage of Single-Bit First-Order Delta-Sigma Modulator Using DC Input	X.-L. Huang;C.-Y. Yang;J.-L. Huang; X.-L. Huang; C.-Y. Yang; J.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:03Z	Characterizing Integrator Leakage of Single-Bit DS Modulator Using DC Input	X.-L. Huang;Y.-C. Yu;J.-L. Huang; X.-L. Huang; Y.-C. Yu; J.-L. Huang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:03Z	Characterizing Integrator Leakage of Single-Bit DS Modulator Using DC Input	X.-L. Huang;Y.-C. Yu;J.-L. Huang; X.-L. Huang; Y.-C. Yu; J.-L. Huang; JIUN-LANG HUANG

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