臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

	English \| 正體中文 \| 简体中文 \| 2830311
	???header.visitor??? : 32530051 ???header.onlineuser??? : 1120 ???header.sponsordeclaration???

???search.scope???

???search.advance???

???search.login???

???search.administrator???

臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

???ui.leftmenu.abouttair???
	???ui.leftmenu.explanation???

???ui.leftmenu.bartitle???
	Repositories
	Author
	Title
	Date
	???ui.leftmenu.statisticschart???
	???ui.leftmenu.realtimefacts???
	???ui.leftmenu.trend???

???index.news???
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

???ui.leftmenu.copyrighttitle???
	???ui.leftmenu.copyrightpublisher???
	???ui.leftmenu.copyrightconference???

???ui.leftmenu.link???
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"x wen"???jsp.browse.items-by-author.description???

???jsp.browse.items-by-author.back???
???jsp.browse.items-by-author.order1???	???jsp.browse.items-by-author.order2???

Showing items 1-10 of 10 (1 Page(s) Totally)
1
View [10|25|50] records per page

Institution	Date	Title	Author
臺大學術典藏	2018-09-10T09:50:52Z	On guaranteeing capture safety in at-speed scan testing with broadcast-scan-based test compression	K. Enokimoto;X. Wen;K. Miyase;J.-L. Huang;S. Kajihara;L.-T. Wang; K. Enokimoto; X. Wen; K. Miyase; J.-L. Huang; S. Kajihara; L.-T. Wang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:50:52Z	On guaranteeing capture safety in at-speed scan testing with broadcast-scan-based test compression	K. Enokimoto;X. Wen;K. Miyase;J.-L. Huang;S. Kajihara;L.-T. Wang; K. Enokimoto; X. Wen; K. Miyase; J.-L. Huang; S. Kajihara; L.-T. Wang; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:31Z	Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,	S. Wu;L. T. Wang;X. Wen;W. B. Jone;M. S. Hsiao;F. Li;J. C. M. Li;J. L. Huang; S. Wu; L. T. Wang; X. Wen; W. B. Jone; M. S. Hsiao; F. Li; J. C. M. Li; J. L. Huang; CHIEN-MO LI; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:31Z	Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains,	S. Wu;L. T. Wang;X. Wen;W. B. Jone;M. S. Hsiao;F. Li;J. C. M. Li;J. L. Huang; S. Wu; L. T. Wang; X. Wen; W. B. Jone; M. S. Hsiao; F. Li; J. C. M. Li; J. L. Huang; CHIEN-MO LI; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	A transition isolation scan cell design for low shift and capture power	Y.-T. Lin;J.-L. Huang;X. Wen; Y.-T. Lin; J.-L. Huang; X. Wen; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T09:25:29Z	A transition isolation scan cell design for low shift and capture power	Y.-T. Lin;J.-L. Huang;X. Wen; Y.-T. Lin; J.-L. Huang; X. Wen; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T08:47:22Z	Clock-Gating-Aware Low Launch WSA Test Pattern Generation for At-Speed Scan Testing	Y.-T. Lin; J.-L. Huang; X. Wen; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:03Z	Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment	M.-F. Wu;J.-L. Huang;X. Wen;K. Miyase; M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:43:03Z	Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment	M.-F. Wu;J.-L. Huang;X. Wen;K. Miyase; M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG
臺大學術典藏	2018-09-10T07:09:28Z	Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Testing	M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG

Showing items 1-10 of 10 (1 Page(s) Totally)
1
View [10|25|50] records per page