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机构 日期 题名 作者
國立成功大學 2022-07 Charge-Discharge Mechanism of High-Entropy Co-Free Spinel Oxide Toward Li+ Storage Examined Using Operando Quick-Scanning X-Ray Absorption Spectroscopy Luo;Xu-Feng;Patra;Jagabandhu;Chuang;Wei-Tsung;Nguyen;Xuyen, Thi;Ting;Jyh-Ming;Li;Ju;Pao;Chih-Wen;Chang;Jeng-Kuei
國立交通大學 2019-04-03T06:41:32Z Electromigration Mechanism of Failure in Flip-Chip Solder Joints Based on Discrete Void Formation Chang, Yuan-Wei; Cheng, Yin; Helfen, Lukas; Xu, Feng; Tian, Tian; Scheel, Mario; Di Michiel, Marco; Chen, Chih; Tu, King-Ning; Baumbach, Tilo
國立交通大學 2019-04-02T05:59:55Z Strain-induced superconducting pair density wave states in graphene Xu, Feng; Chou, Po-Hao; Chung, Chung-Hou; Lee, Ting-Kuo; Mou, Chung-Yu
國立交通大學 2018-08-21T05:56:50Z Study of Discrete Voids Formation in Flip-Chip Solder Joints due to Electromigration Using In-Situ 3D Laminography and Finite-Element Modeling Chang, Yuan-Wei; Cheng, Yin; Xu, Feng; Helfen, Lukas; Tian, Tian; Di Michiel, Marco; Chen, Chih; Tu, King-Ning; Baumbach, Tilo
國立交通大學 2017-04-21T06:55:10Z Study of electromigration-induced formation of discrete voids in flip-chip solder joints by in-situ 3D laminography observation and finite-element modeling Chang, Yuan-Wei; Cheng, Yin; Xu, Feng; Helfen, Lukas; Tian, Tian; Di Michiel, Marco; Chen, Chih; Tu, King-Ning; Baumbach, Tilo

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