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| 國立成功大學 |
2012-12-17 |
Photoelectric heat effect induce instability on the negative bias temperature illumination stress for InGaZnO thin film transistors
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Huang, SY�(Huang, Sheng-Yao)�; �Chang, TC�(Chang, Ting-Chang); Yang, MC�(Yang, Man-Chun)�; �Lin, LW�(Lin, Li-Wei); �Wu, MH�(Wu, Ming-hsin); Yang, KH�(Yang, Kai-Hsiang)�; �Chen, MC�(Chen, Min-Chen)�; �Chiu, YJ�(Chiu, Yi-Jen); �Yeh, BL�(Yeh, Bo-Liang) |
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