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"yang yi lin"的相关文件
显示项目 11-20 / 20 (共2页)
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| 國立臺灣大學 |
2008 |
Effect of strain-temperature stress on MOS structure with ultra-thin gate oxide
|
Lin, Chia-Nan; Yang, Yi-Lin; Chen, Wei-Ting; Lin, Shang-Chih; Chuang, Kai-Chieh; Hwu, Jenn-Gwo |
| 國立彰化師範大學 |
2007-06 |
Competency Index Construction for Employee of Intellectual Property Technology Service Industry
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Chang, Shu-Hsuan; Yang, Yi-lin; Shen, Yung-chi |
| 國立彰化師範大學 |
2007 |
Construction of Student Selection Tool for Technology-based Entrepreneurship Education Program
|
Chang, Shu-Hsuan; Yang, Yi-Lin; Shen, Yung-Chi |
| 國立臺灣大學 |
2007 |
Modeling and Characterization of Hydrogen Induced Charge Loss in Nitride Trapping Memory
|
Yang, Yi-Lin; Chang, Chia-Hua; Shih, Yen-Hao; Hsieh, Kuang-Yeu; Hwu, Jenn-Gwo |
| 國立彰化師範大學 |
2006-12 |
Corporate Venture Mode Selection Decision for Printed Circuit Board Industry
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Chang, Shu-Hsuan; Yen, Shin-Yi; Yang, Yi-Lin; Hu, Hsiao-Ling |
| 國立臺灣大學 |
2006 |
Impact of Strain-Temperature Stress on Ultrathin Oxide
|
Tung, Chia-Wei; Yang, Yi-Lin; Hwu, Jenn-Gwo |
| 國立政治大學 |
2005 |
創新環境、網絡與創新成效之研究
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楊奕泠; Yang, Yi-Lin |
| 國立臺灣大學 |
2004-10 |
Quality Improvement of Ultrathin Gate Oxide by Using Thermal Growth Followed by SF ANO Technique
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Yang, Yi-Lin; Hwu, Jenn-Gwo |
| 臺大學術典藏 |
2004-10 |
Quality Improvement of Ultrathin Gate Oxide by Using Thermal Growth Followed by SF ANO Technique
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Yang, Yi-Lin; Hwu, Jenn-Gwo; Yang, Yi-Lin; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2004 |
Growth-Then-Anodization Technique for Reliable Ultrathin Gate Oxides
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Liao, Wei-Jian; Yang, Yi-Lin; Chuang, Shun-Cheng; Hwu, Jenn-Gwo |
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