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Institution Date Title Author
國立臺灣大學 2008 Effect of strain-temperature stress on MOS structure with ultra-thin gate oxide Lin, Chia-Nan; Yang, Yi-Lin; Chen, Wei-Ting; Lin, Shang-Chih; Chuang, Kai-Chieh; Hwu, Jenn-Gwo
國立彰化師範大學 2007-06 Competency Index Construction for Employee of Intellectual Property Technology Service Industry Chang, Shu-Hsuan; Yang, Yi-lin; Shen, Yung-chi
國立彰化師範大學 2007 Construction of Student Selection Tool for Technology-based Entrepreneurship Education Program Chang, Shu-Hsuan; Yang, Yi-Lin; Shen, Yung-Chi
國立臺灣大學 2007 Modeling and Characterization of Hydrogen Induced Charge Loss in Nitride Trapping Memory Yang, Yi-Lin; Chang, Chia-Hua; Shih, Yen-Hao; Hsieh, Kuang-Yeu; Hwu, Jenn-Gwo
國立彰化師範大學 2006-12 Corporate Venture Mode Selection Decision for Printed Circuit Board Industry Chang, Shu-Hsuan; Yen, Shin-Yi; Yang, Yi-Lin; Hu, Hsiao-Ling
國立臺灣大學 2006 Impact of Strain-Temperature Stress on Ultrathin Oxide Tung, Chia-Wei; Yang, Yi-Lin; Hwu, Jenn-Gwo
國立政治大學 2005 創新環境、網絡與創新成效之研究 楊奕泠; Yang, Yi-Lin
國立臺灣大學 2004-10 Quality Improvement of Ultrathin Gate Oxide by Using Thermal Growth Followed by SF ANO Technique Yang, Yi-Lin; Hwu, Jenn-Gwo
臺大學術典藏 2004-10 Quality Improvement of Ultrathin Gate Oxide by Using Thermal Growth Followed by SF ANO Technique Yang, Yi-Lin; Hwu, Jenn-Gwo; Yang, Yi-Lin; Hwu, Jenn-Gwo
國立臺灣大學 2004 Growth-Then-Anodization Technique for Reliable Ultrathin Gate Oxides Liao, Wei-Jian; Yang, Yi-Lin; Chuang, Shun-Cheng; Hwu, Jenn-Gwo

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