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| 國立成功大學 |
2020 |
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations
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Tsai, F.-J.;Ye, C.-S.;Lee, K.-J.;Zheng, S.-X.;Huang, Y.;Cheng, W.-T.;Reddy, S.M.;Kassab, M.;Rajski, J.;Wang, C.;Zawada, J. |
| 國立成功大學 |
2020 |
Efficient Prognostication of Pattern Count with Different Input Compression Ratios
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Tsai, F.-J.;Ye, C.-S.;Huang, Y.;Lee, K.-J.;Cheng, W.-T.;Reddy, S.M.;Kassab, M.;Rajski, J. |
| 國立成功大學 |
2020 |
Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels
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Tsai, F.-J.;Ye, C.-S.;Huang, Y.;Lee, K.-J.;Cheng, W.-T.;Reddy, S.M.;Kassab, M.;Rajski, J.;Zheng, S.-X. |
| 國立成功大學 |
2019 |
Deep Learning Based Test Compression Analyzer
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Wu, C.-H.;Huang, Y.;Lee, K.-J.;Cheng, W.-T.;Veda, G.;Reddy, S.;Hu, C.-C.;Ye, C.-S. |
| 國立成功大學 |
2012 |
New compact tri-band bandpass filter with transmission zeros designed by using stub-loaded resonators
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Ye, C. -S.; Su, Y. -K.; Weng, M. -H. |
Showing items 1-5 of 5 (1 Page(s) Totally)
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