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Taiwan Academic Institutional Repository >
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"yeh cf"
Showing items 41-50 of 119 (12 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:40:40Z |
Investigation of grain boundary control in the drain junction on laser-crystalized poly-Si thin film transistors
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Chen, TF; Yeh, CF; Lou, JC |
| 國立交通大學 |
2014-12-08T15:40:19Z |
Device transfer technology by backside etching (DTBE) for poly-Si thin-film transistors on glass/plastic substrate
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Wang, SC; Yeh, CF; Huang, CK; Dai, YT |
| 國立交通大學 |
2014-12-08T15:39:17Z |
The removal of airborne molecular contamination in cleanroom using PTFE and chemical filters
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Yeh, CF; Hsiao, CW; Lin, SJ; Hsieh, CM; Kusumi, T; Aomi, H; Kaneko, H; Dai, BT; Tsai, MS |
| 國立交通大學 |
2014-12-08T15:39:11Z |
Impact of air filter material on metal oxide semiconductor (MOS) device characteristics in HF vapor environment
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Hsiao, CW; Lou, JC; Yeh, CF; Hsieh, CM; Lin, SJ; Kusumi, T |
| 國立交通大學 |
2014-12-08T15:39:10Z |
Effects of grain boundaries on performance and hot-carrier reliability of excimer-laser annealed polycrystalline silicon thin film transistors
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Chen, TF; Yeh, CF; Lou, JC |
| 國立交通大學 |
2014-12-08T15:39:08Z |
A novel four-mask-processed poly-Si TFT fabricated using excimer laser crystallization of an edge-thickened alpha-Si active island
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Chen, TF; Yeh, CF; Liu, CY; Lou, JC |
| 國立交通大學 |
2014-12-08T15:37:19Z |
Post-Cu CMP cleaning for colloidal silica abrasive removal
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Chen, PL; Chen, JH; Tsai, MS; Dai, BT; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:37:17Z |
Influence of measuring environment on the electrical characteristics of pentacene-based thin film transistors
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Wang, YW; Cheng, HL; Wang, YK; Hu, TH; Ho, JC; Lee, CC; Lei, TF; Yeh, CF |
| 國立交通大學 |
2014-12-08T15:37:09Z |
Fabricating thin-film transistors on plastic substrates using spin etching and device transfer
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Wang, SC; Yeh, CF; Hsu, CT; Lou, JC |
| 國立交通大學 |
2014-12-08T15:37:02Z |
Process improvement and reliability characteristics of spin-on poly-3-hexylthiophene thin-film transistor
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Wang, SC; Lou, JC; Liou, BL; Lin, RX; Yeh, CF |
Showing items 41-50 of 119 (12 Page(s) Totally)
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