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Showing items 51-75 of 119  (5 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:27:43Z Novel low-stress SiO2-F-x(x) film deposited by room-temperature liquid-phase deposition method Yeh, CF; Lin, SS
國立交通大學 2014-12-08T15:27:41Z Low temperature processed poly-Si thin-film transistors with thinner LPD-SiO2 as gate insulator and its reliability Fan, CL; Yeh, CF; Tsai, HK; Lur, W; Yen, PW
國立交通大學 2014-12-08T15:27:40Z Approach to room temperature process - A novel thin liquid-phase deposited oxide Yeh, CF; Lin, SS
國立交通大學 2014-12-08T15:27:39Z Investigation of high-power device and process for field emission display Yeh, CF; Liu, JS; Huang, CM
國立交通大學 2014-12-08T15:27:34Z Selective SiO2-xFx growth with liquid-phase deposition for MEMS technology Yeh, CF; Lee, YC; Su, JL
國立交通大學 2014-12-08T15:27:33Z A physically-based built-in Spice Poly-Si TFT model for circuit simulation and reliability evaluation Chung, SS; Chen, DC; Cheng, CT; Yeh, CF
國立交通大學 2014-12-08T15:27:30Z Passivation effects of ion plating capping oxide on poly-Si TFTs Yeh, CF; Chen, TJ; Kao, JS
國立交通大學 2014-12-08T15:27:24Z In-situ O-2-plasma passivation effect on poly-Si TFTs during ion plating capping oxide Yeh, CF; Chen, TJ; Lin, MT; Kao, JS
國立交通大學 2014-12-08T15:27:24Z Effect of processing temperature on polysilicon thin-film transistors with liquid-phase deposited oxide as gate insulator Yeh, CF; Chen, TJ; Jeng, JN
國立交通大學 2014-12-08T15:27:15Z Applying selective liquid-phase deposition to create contact holes in plasma damage-free process Yeh, CF; Liu, CH
國立交通大學 2014-12-08T15:27:14Z Newly developed low-K and low-stress fluorinated silicon oxide utilizing temperature-difference liquid-phase deposition technology Yeh, CF; Lee, YC; Lee, SC
國立交通大學 2014-12-08T15:27:13Z Highly reliable liquid-phase deposited SiO2 with nitrous oxide plasma post-treatment for low temperature processed poly-Si TFT's Yeh, CF; Chen, DC; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ
國立交通大學 2014-12-08T15:27:06Z O-2-plasma degradation of low-k organic dielectric and its effective solution for damascene trenches Yeh, CF; Lee, YC; Su, YC; Wu, KH; Lin, CH
國立交通大學 2014-12-08T15:26:42Z Smart dielectrics of fluorinated silicon glass prepared by liquid phase deposition method Yeh, CF; Chen, TF; Lee, YC; Liu, CH; Lin, SS
國立交通大學 2014-12-08T15:26:34Z Impact of airborne molecular contamination to nano-device performance Yeh, CF; Hsiao, CW; Lin, SJ; Xie, ZM; Kusumi, T; Aomi, H; Kaneko, H; Da, BT; Tsai, MS
國立交通大學 2014-12-08T15:25:48Z Fabrication of thin-film transistors on plastic substrates by spin etching and device transfer process Wang, SC; Hsu, CT; Yeh, CF; Lou, JC
國立交通大學 2014-12-08T15:25:27Z A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices Chung, SS; Liu, YR; Yeh, CF; Wu, SR; Lai, CS; Chang, TY; Ho, JH; Liu, CY; Huang, CT; Tsai, CT; Shiau, WT; Sun, SW
國立交通大學 2014-12-08T15:18:03Z Pentacene-based thin film transistors used to drive a twist-nematic liquid crystal display Wang, YW; Cheng, HL; Wang, YK; Hu, TH; Ho, JC; Lee, CC; Lei, TF; Yeh, CF
國立交通大學 2014-12-08T15:05:01Z INVESTIGATION OF THERMAL COEFFICIENT FOR POLYCRYSTALLINE SILICON THERMAL SENSOR DIODE YEH, CF; LIN, SS; YANG, GP
國立交通大學 2014-12-08T15:04:55Z THE NOVEL PREPARATION OF P-N-JUNCTION MESA DIODES BY SILICON-WAFER DIRECT BONDING (SDB) YEH, CF; SHYANG, HL
國立交通大學 2014-12-08T15:04:47Z THE EFFECT OF TEMPERATURE ON I-V-CHARACTERISTICS OF A-SI-H PHOTODIODE CHANG, KL; YEH, CF
國立交通大學 2014-12-08T15:04:31Z THE CHARACTERIZATION OF AL2O3 PREPARED BY ANODIC-OXIDATION YEH, CF; CHENG, JY; LU, JH
國立交通大學 2014-12-08T15:04:25Z NOVEL TECHNIQUE FOR SIO2 FORMED BY LIQUID-PHASE DEPOSITION FOR LOW-TEMPERATURE PROCESSED POLYSILICON TFT YEH, CF; LIN, SS; CHEN, CL; YANG, YC
國立交通大學 2014-12-08T15:04:20Z EXPERIMENTAL COMPARISON OF OFF-STATE CURRENT BETWEEN HIGH-TEMPERATURE-PROCESSED AND LOW-TEMPERATURE-PROCESSED UNDOPED CHANNEL POLYSILICON THIN-FILM TRANSISTORS YEH, CF; YANG, TZ; CHEN, CL; CHEN, TJ; YANG, YC
國立交通大學 2014-12-08T15:04:20Z INVESTIGATION OF SI-SIO2 INTERFACE PROPERTIES FOR BONDED SILICON-ON-INSULATOR YEH, CF; KAO, HW; CHANG, BS; CHANG, KL

Showing items 51-75 of 119  (5 Page(s) Totally)
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