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机构 日期 题名 作者
國立交通大學 2014-12-08T15:44:47Z Characterization and reliability of lightly-doped-drain polysilicon thin-film transistors with oxide sidewall spacer formed by one-step selective liquid phase deposition Shih, PS; Chang, TC; Huang, TY; Yeh, CF; Chang, CY
國立交通大學 2014-12-08T15:44:44Z Reliability of fluorinated silicon oxide film prepared by temperature difference-based liquid phase deposition Yeh, CF; Lee, YC; Lee, SC
國立交通大學 2014-12-08T15:44:36Z Novel barrier dielectric liner prepared by liquid-phase deposition and NH3-plasma annealing Yeh, CF; Lee, YC; Chen, CM; Wu, KH
國立交通大學 2014-12-08T15:41:55Z Highly reliable liquid-phase-deposited SiO2 with nitrous oxide plasma post-treatment for low-temperature-processed polysilicon thin film transistors Yeh, CF; Chen, DCH; Lu, CY; Liu, C; Lee, ST; Liu, CH; Chen, TJ
國立交通大學 2014-12-08T15:40:44Z Novel post CMP cleaning using buffered HF solution and ozone water Yeh, CF; Hsiao, CW; Lee, WS
國立交通大學 2014-12-08T15:40:40Z Investigation of grain boundary control in the drain junction on laser-crystalized poly-Si thin film transistors Chen, TF; Yeh, CF; Lou, JC
國立交通大學 2014-12-08T15:40:19Z Device transfer technology by backside etching (DTBE) for poly-Si thin-film transistors on glass/plastic substrate Wang, SC; Yeh, CF; Huang, CK; Dai, YT
國立交通大學 2014-12-08T15:39:17Z The removal of airborne molecular contamination in cleanroom using PTFE and chemical filters Yeh, CF; Hsiao, CW; Lin, SJ; Hsieh, CM; Kusumi, T; Aomi, H; Kaneko, H; Dai, BT; Tsai, MS
國立交通大學 2014-12-08T15:39:11Z Impact of air filter material on metal oxide semiconductor (MOS) device characteristics in HF vapor environment Hsiao, CW; Lou, JC; Yeh, CF; Hsieh, CM; Lin, SJ; Kusumi, T
國立交通大學 2014-12-08T15:39:10Z Effects of grain boundaries on performance and hot-carrier reliability of excimer-laser annealed polycrystalline silicon thin film transistors Chen, TF; Yeh, CF; Lou, JC

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